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- Publisher Website: 10.1002/anie.201505461
- Scopus: eid_2-s2.0-84945245491
- PMID: 26352027
- WOS: WOS:000363389400030
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Article: Definitive Molecular Level Characterization of Defects in UiO-66 Crystals
Title | Definitive Molecular Level Characterization of Defects in UiO-66 Crystals |
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Authors | |
Keywords | metal-organic frameworks single crystals X-ray diffraction structure elucidation UiO-66 |
Issue Date | 2015 |
Citation | Angewandte Chemie - International Edition, 2015, v. 54, n. 38, p. 11162-11167 How to Cite? |
Abstract | The identification and characterization of defects, on the molecular level, in metal-organic frameworks (MOFs) remain a challenge. With the extensive use of single-crystal X-ray diffraction (SXRD), the missing linker defects in the zirconium-based MOF UiO-66, Zr6O4(OH)4(C8H4O4)6, have been identified as water molecules coordinated directly to the zirconium centers. Charge balancing is achieved by hydroxide anions, which are hydrogen bonded within the pores of the framework. Furthermore, the precise nature of the defects and their concentration can be manipulated by altering the starting materials, synthesis conditions, and post-synthetic modifications. |
Persistent Identifier | http://hdl.handle.net/10722/303463 |
ISSN | 2023 Impact Factor: 16.1 2023 SCImago Journal Rankings: 5.300 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Trickett, Christopher A. | - |
dc.contributor.author | Gagnon, Kevin J. | - |
dc.contributor.author | Lee, Seungkyu | - |
dc.contributor.author | Gándara, Felipe | - |
dc.contributor.author | Bürgi, Hans Beat | - |
dc.contributor.author | Yaghi, Omar M. | - |
dc.date.accessioned | 2021-09-15T08:25:22Z | - |
dc.date.available | 2021-09-15T08:25:22Z | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | Angewandte Chemie - International Edition, 2015, v. 54, n. 38, p. 11162-11167 | - |
dc.identifier.issn | 1433-7851 | - |
dc.identifier.uri | http://hdl.handle.net/10722/303463 | - |
dc.description.abstract | The identification and characterization of defects, on the molecular level, in metal-organic frameworks (MOFs) remain a challenge. With the extensive use of single-crystal X-ray diffraction (SXRD), the missing linker defects in the zirconium-based MOF UiO-66, Zr6O4(OH)4(C8H4O4)6, have been identified as water molecules coordinated directly to the zirconium centers. Charge balancing is achieved by hydroxide anions, which are hydrogen bonded within the pores of the framework. Furthermore, the precise nature of the defects and their concentration can be manipulated by altering the starting materials, synthesis conditions, and post-synthetic modifications. | - |
dc.language | eng | - |
dc.relation.ispartof | Angewandte Chemie - International Edition | - |
dc.subject | metal-organic frameworks | - |
dc.subject | single crystals | - |
dc.subject | X-ray diffraction | - |
dc.subject | structure elucidation | - |
dc.subject | UiO-66 | - |
dc.title | Definitive Molecular Level Characterization of Defects in UiO-66 Crystals | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1002/anie.201505461 | - |
dc.identifier.pmid | 26352027 | - |
dc.identifier.scopus | eid_2-s2.0-84945245491 | - |
dc.identifier.volume | 54 | - |
dc.identifier.issue | 38 | - |
dc.identifier.spage | 11162 | - |
dc.identifier.epage | 11167 | - |
dc.identifier.eissn | 1521-3773 | - |
dc.identifier.isi | WOS:000363389400030 | - |