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- Publisher Website: 10.1088/1361-6463/ac19df
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Article: Carbon vacancy control in p(+)-n silicon carbide diodes for high voltage bipolar applications
Title | Carbon vacancy control in p(+)-n silicon carbide diodes for high voltage bipolar applications |
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Authors | |
Keywords | carbon vacancy DLTS high voltage bipolar devices silicon carbide (SiC) thermodynamic equilibrium |
Issue Date | 2021 |
Publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpd |
Citation | Journal of Physics D: Applied Physics, 2021, v. 54 n. 45, p. article no. 455106 How to Cite? |
Abstract | Controlling the carbon vacancy (VC) in silicon carbide (SiC) is one of the major remaining bottleneck in manufacturing of high voltage SiC bipolar devices, because VC provokes recombination levels in the bandgap, offensively reducing the charge carrier lifetime. In literature, prominent VC evolutions have been measured by capacitance spectroscopy employing Schottky diodes, however the trade-offs occurring in the p+-n diodes received much less attention. In the present work, applying similar methodology, we showed that VC is re-generated to its unacceptably high equilibrium level at ∼2$ imes10^{13}$ VC cm−3 by 1800 °C anneals required for the implanted acceptor activation in the p+-n components. Nevertheless, we have also demonstrated that the VC eliminating by thermodynamic equilibrium anneals at 1500 °C employing carbon-cap can be readily integrated into the p+-n components fabrication resulting in $leqslant!!!10^{11}$ VC cm−3, potentially paving the way towards the realization of the high voltage SiC bipolar devices. |
Persistent Identifier | http://hdl.handle.net/10722/304277 |
ISSN | 2021 Impact Factor: 3.409 2020 SCImago Journal Rankings: 0.857 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Ayedh, HM | - |
dc.contributor.author | Kvamsdal, KE | - |
dc.contributor.author | Bobal, V | - |
dc.contributor.author | Hallén, A | - |
dc.contributor.author | Ling, FCC | - |
dc.contributor.author | Kuznetsov, AY | - |
dc.date.accessioned | 2021-09-23T08:57:46Z | - |
dc.date.available | 2021-09-23T08:57:46Z | - |
dc.date.issued | 2021 | - |
dc.identifier.citation | Journal of Physics D: Applied Physics, 2021, v. 54 n. 45, p. article no. 455106 | - |
dc.identifier.issn | 0022-3727 | - |
dc.identifier.uri | http://hdl.handle.net/10722/304277 | - |
dc.description.abstract | Controlling the carbon vacancy (VC) in silicon carbide (SiC) is one of the major remaining bottleneck in manufacturing of high voltage SiC bipolar devices, because VC provokes recombination levels in the bandgap, offensively reducing the charge carrier lifetime. In literature, prominent VC evolutions have been measured by capacitance spectroscopy employing Schottky diodes, however the trade-offs occurring in the p+-n diodes received much less attention. In the present work, applying similar methodology, we showed that VC is re-generated to its unacceptably high equilibrium level at ∼2$ imes10^{13}$ VC cm−3 by 1800 °C anneals required for the implanted acceptor activation in the p+-n components. Nevertheless, we have also demonstrated that the VC eliminating by thermodynamic equilibrium anneals at 1500 °C employing carbon-cap can be readily integrated into the p+-n components fabrication resulting in $leqslant!!!10^{11}$ VC cm−3, potentially paving the way towards the realization of the high voltage SiC bipolar devices. | - |
dc.language | eng | - |
dc.publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpd | - |
dc.relation.ispartof | Journal of Physics D: Applied Physics | - |
dc.rights | Journal of Physics D: Applied Physics. Copyright © Institute of Physics Publishing. | - |
dc.rights | This is an author-created, un-copyedited version of an article published in [insert name of journal]. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://dx.doi.org/[insert DOI]. | - |
dc.subject | carbon vacancy | - |
dc.subject | DLTS | - |
dc.subject | high voltage bipolar devices | - |
dc.subject | silicon carbide (SiC) | - |
dc.subject | thermodynamic equilibrium | - |
dc.title | Carbon vacancy control in p(+)-n silicon carbide diodes for high voltage bipolar applications | - |
dc.type | Article | - |
dc.identifier.email | Ling, FCC: ccling@hkucc.hku.hk | - |
dc.identifier.authority | Ling, FCC=rp00747 | - |
dc.identifier.doi | 10.1088/1361-6463/ac19df | - |
dc.identifier.scopus | eid_2-s2.0-85114685185 | - |
dc.identifier.hkuros | 324917 | - |
dc.identifier.volume | 54 | - |
dc.identifier.issue | 45 | - |
dc.identifier.spage | article no. 455106 | - |
dc.identifier.epage | article no. 455106 | - |
dc.identifier.isi | WOS:000687837200001 | - |
dc.publisher.place | United Kingdom | - |