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Article: Thin-Film Transistors With the Fringe Effect and the Correction Factor for Mobility Extraction

TitleThin-Film Transistors With the Fringe Effect and the Correction Factor for Mobility Extraction
Authors
Chen, CDChen, ZHXu, KJZheng, JWOu, HWang, ZGChen, HJLiu, XYWu, QChan, KLLiu, C
Issue Date2019
PublisherIEEE-Inst Electrical Electronics Engineers INC. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55
Citation
IEEE Electron Device Letters, 2019, v. 40 n. 6, p. 897-900 How to Cite?
DOI: http://dx.doi.org/10.1109/LED.2019.2909282
Persistent Identifierhttp://hdl.handle.net/10722/312672
ISI Accession Number ID
WOS:000469848300014

 

DC FieldValueLanguage
dc.contributor.authorChen, CD-
dc.contributor.authorChen, ZH-
dc.contributor.authorXu, KJ-
dc.contributor.authorZheng, JW-
dc.contributor.authorOu, H-
dc.contributor.authorWang, ZG-
dc.contributor.authorChen, HJ-
dc.contributor.authorLiu, XY-
dc.contributor.authorWu, Q-
dc.contributor.authorChan, KL-
dc.contributor.authorLiu, C-
dc.date.accessioned2022-05-12T10:54:00Z-
dc.date.available2022-05-12T10:54:00Z-
dc.date.issued2019-
dc.identifier.citationIEEE Electron Device Letters, 2019, v. 40 n. 6, p. 897-900-
dc.identifier.urihttp://hdl.handle.net/10722/312672-
dc.languageeng-
dc.publisherIEEE-Inst Electrical Electronics Engineers INC. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55-
dc.relation.ispartofIEEE Electron Device Letters-
dc.titleThin-Film Transistors With the Fringe Effect and the Correction Factor for Mobility Extraction-
dc.typeArticle-
dc.identifier.emailChan, KL: pklc@hku.hk-
dc.identifier.authorityChan, KL=rp01532-
dc.identifier.doi10.1109/LED.2019.2909282-
dc.identifier.hkuros332952-
dc.identifier.volume40-
dc.identifier.issue6-
dc.identifier.spage897-
dc.identifier.epage900-
dc.identifier.isiWOS:000469848300014-
dc.publisher.placeUSA-

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