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Article: Photoluminescence intensity of Cu-doped ZnO modulated via defect occupancy by applying electric bias

TitlePhotoluminescence intensity of Cu-doped ZnO modulated via defect occupancy by applying electric bias
Authors
HO, LPYounas, MBorgersen, JKhan, RTARezvani, SJPollastri, SAkhtar, MJNadeem, MHuang, DShi, YKuznetsov, ALing, FCC
Issue Date2022
PublisherIOP Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpd
Citation
Journal of Physics D: Applied Physics, 2022, v. 55 n. 31, p. 315102:1-8 How to Cite?
DOI: http://dx.doi.org/10.1088/1361-6463/ac6912
Persistent Identifierhttp://hdl.handle.net/10722/314439
ISI Accession Number ID
WOS:000797194100001

 

DC FieldValueLanguage
dc.contributor.authorHO, LP-
dc.contributor.authorYounas, M-
dc.contributor.authorBorgersen, J-
dc.contributor.authorKhan, RTA-
dc.contributor.authorRezvani, SJ-
dc.contributor.authorPollastri, S-
dc.contributor.authorAkhtar, MJ-
dc.contributor.authorNadeem, M-
dc.contributor.authorHuang, D-
dc.contributor.authorShi, Y-
dc.contributor.authorKuznetsov, A-
dc.contributor.authorLing, FCC-
dc.date.accessioned2022-07-22T05:24:34Z-
dc.date.available2022-07-22T05:24:34Z-
dc.date.issued2022-
dc.identifier.citationJournal of Physics D: Applied Physics, 2022, v. 55 n. 31, p. 315102:1-8-
dc.identifier.urihttp://hdl.handle.net/10722/314439-
dc.languageeng-
dc.publisherIOP Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpd-
dc.relation.ispartofJournal of Physics D: Applied Physics-
dc.rightsJournal of Physics D: Applied Physics. Copyright © IOP Publishing.-
dc.rightsThis is an author-created, un-copyedited version of an article published in [insert name of journal]. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://dx.doi.org/[insert DOI].-
dc.titlePhotoluminescence intensity of Cu-doped ZnO modulated via defect occupancy by applying electric bias-
dc.typeArticle-
dc.identifier.emailShi, Y: ylshi0@hku.hk-
dc.identifier.emailLing, FCC: ccling@hkucc.hku.hk-
dc.identifier.authorityLing, FCC=rp00747-
dc.identifier.doi10.1088/1361-6463/ac6912-
dc.identifier.hkuros334561-
dc.identifier.volume55-
dc.identifier.issue31-
dc.identifier.spage315102:1-
dc.identifier.epage8-
dc.identifier.isiWOS:000797194100001-

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