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- Publisher Website: 10.1039/D1CS00264C
- Scopus: eid_2-s2.0-85124174273
- PMID: 35014665
- WOS: WOS:000741038600001
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Article: Wafer-scale single-orientation 2D layers by atomic edge-guided epitaxial growth
Title | Wafer-scale single-orientation 2D layers by atomic edge-guided epitaxial growth |
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Authors | |
Issue Date | 2022 |
Citation | Chemical Society Reviews, 2022, v. 51 n. 3, p. 803-811 How to Cite? |
Abstract | Two-dimensional (2D) layered materials hold tremendous promise for post-Si nanoelectronics due to their unique optical and electrical properties. Significant advances have been achieved in device fabrication and synthesis routes for 2D nanoelectronics over the past decade; however, one major bottleneck preventing their immediate applications has been the lack of a reproducible approach for growing wafer-scale single-crystal films despite tremendous progress in recent experimental demonstrations. In this tutorial review, we provide a systematic summary of the critical factors - including crystal/substrate symmetry and energy consideration - necessary for synthesizing single-orientation 2D layers. In particular, we focus on the discussions of the atomic edge-guided epitaxial growth, which assists in unidirectional nucleation for the wafer-scale growth of single-crystal 2D layers. |
Persistent Identifier | http://hdl.handle.net/10722/315522 |
ISSN | 2023 Impact Factor: 40.4 2023 SCImago Journal Rankings: 12.511 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Wan, Y | - |
dc.contributor.author | Fu, J | - |
dc.contributor.author | Chuu, C | - |
dc.contributor.author | Tung, V | - |
dc.contributor.author | Shi, Y | - |
dc.contributor.author | Li, L | - |
dc.date.accessioned | 2022-08-19T08:59:28Z | - |
dc.date.available | 2022-08-19T08:59:28Z | - |
dc.date.issued | 2022 | - |
dc.identifier.citation | Chemical Society Reviews, 2022, v. 51 n. 3, p. 803-811 | - |
dc.identifier.issn | 0306-0012 | - |
dc.identifier.uri | http://hdl.handle.net/10722/315522 | - |
dc.description.abstract | Two-dimensional (2D) layered materials hold tremendous promise for post-Si nanoelectronics due to their unique optical and electrical properties. Significant advances have been achieved in device fabrication and synthesis routes for 2D nanoelectronics over the past decade; however, one major bottleneck preventing their immediate applications has been the lack of a reproducible approach for growing wafer-scale single-crystal films despite tremendous progress in recent experimental demonstrations. In this tutorial review, we provide a systematic summary of the critical factors - including crystal/substrate symmetry and energy consideration - necessary for synthesizing single-orientation 2D layers. In particular, we focus on the discussions of the atomic edge-guided epitaxial growth, which assists in unidirectional nucleation for the wafer-scale growth of single-crystal 2D layers. | - |
dc.language | eng | - |
dc.relation.ispartof | Chemical Society Reviews | - |
dc.title | Wafer-scale single-orientation 2D layers by atomic edge-guided epitaxial growth | - |
dc.type | Article | - |
dc.identifier.email | Wan, Y: wanyi@hku.hk | - |
dc.identifier.email | Li, L: lanceli1@hku.hk | - |
dc.identifier.authority | Li, L=rp02799 | - |
dc.identifier.doi | 10.1039/D1CS00264C | - |
dc.identifier.pmid | 35014665 | - |
dc.identifier.scopus | eid_2-s2.0-85124174273 | - |
dc.identifier.hkuros | 335497 | - |
dc.identifier.volume | 51 | - |
dc.identifier.issue | 3 | - |
dc.identifier.spage | 803 | - |
dc.identifier.epage | 811 | - |
dc.identifier.isi | WOS:000741038600001 | - |