File Download
There are no files associated with this item.
Links for fulltext
(May Require Subscription)
- Publisher Website: 10.1088/0957-4484/22/35/355702
- Scopus: eid_2-s2.0-79961231849
- WOS: WOS:000294716900010
- Find via
Supplementary
- Citations:
- Appears in Collections:
Article: Quantitative in situ TEM tensile testing of an individual nickel nanowire
Title | Quantitative in situ TEM tensile testing of an individual nickel nanowire |
---|---|
Authors | |
Issue Date | 2011 |
Citation | Nanotechnology, 2011, v. 22, n. 35, article no. 355702 How to Cite? |
Abstract | In this paper, we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ∼ 1.2GPa and an engineering strain of ∼ 4%, which is consistent with earlier experiments performed inside a scanning electron microscope (SEM). With in situ high resolution TEM imaging and diffraction capabilities, this novel experimental set-up could provide unique opportunities to reveal the underlying deformation and damage mechanisms for metals at the nanoscale. © 2011 IOP Publishing Ltd. |
Persistent Identifier | http://hdl.handle.net/10722/326019 |
ISSN | 2023 Impact Factor: 2.9 2023 SCImago Journal Rankings: 0.631 |
ISI Accession Number ID |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lu, Yang | - |
dc.contributor.author | Peng, Cheng | - |
dc.contributor.author | Ganesan, Yogeeswaran | - |
dc.contributor.author | Huang, Jian Yu | - |
dc.contributor.author | Lou, Jun | - |
dc.date.accessioned | 2023-03-09T09:57:26Z | - |
dc.date.available | 2023-03-09T09:57:26Z | - |
dc.date.issued | 2011 | - |
dc.identifier.citation | Nanotechnology, 2011, v. 22, n. 35, article no. 355702 | - |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.uri | http://hdl.handle.net/10722/326019 | - |
dc.description.abstract | In this paper, we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ∼ 1.2GPa and an engineering strain of ∼ 4%, which is consistent with earlier experiments performed inside a scanning electron microscope (SEM). With in situ high resolution TEM imaging and diffraction capabilities, this novel experimental set-up could provide unique opportunities to reveal the underlying deformation and damage mechanisms for metals at the nanoscale. © 2011 IOP Publishing Ltd. | - |
dc.language | eng | - |
dc.relation.ispartof | Nanotechnology | - |
dc.title | Quantitative in situ TEM tensile testing of an individual nickel nanowire | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1088/0957-4484/22/35/355702 | - |
dc.identifier.scopus | eid_2-s2.0-79961231849 | - |
dc.identifier.volume | 22 | - |
dc.identifier.issue | 35 | - |
dc.identifier.spage | article no. 355702 | - |
dc.identifier.epage | article no. 355702 | - |
dc.identifier.eissn | 1361-6528 | - |
dc.identifier.isi | WOS:000294716900010 | - |