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- Publisher Website: 10.1126/sciadv.1501382
- Scopus: eid_2-s2.0-84999847700
- PMID: 27540586
- WOS: WOS:000383734300003
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Article: Approaching the ideal elastic strain limit in silicon nanowires
Title | Approaching the ideal elastic strain limit in silicon nanowires |
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Authors | |
Issue Date | 2016 |
Citation | Science Advances, 2016, v. 2, n. 8, article no. e1501382 How to Cite? |
Abstract | Achieving high elasticity for silicon (Si) nanowires, one of the most important and versatile building blocks in nanoelectronics, would enable their application in flexible electronics and bio-nano interfaces. We show that vapor-liquid-solid–grown single-crystalline Si nanowires with diameters of ~100 nm can be repeatedly stretched above 10% elastic strain at room temperature, approaching the theoretical elastic limit of silicon (17 to 20%). A few samples even reached ~16% tensile strain, with estimated fracture stress up to ~20 GPa. The deformations were fully reversible and hysteresis-free under loading-unloading tests with varied strain rates, and the failures still occurred in brittle fracture, with no visible sign of plasticity. The ability to achieve this “deep ultra-strength” for Si nanowires can be attributed mainly to their pristine, defect-scarce, nanosized single-crystalline structure and atomically smooth surfaces. This result indicates that semiconductor nanowires could have ultra-large elasticity with tunable band structures for promising “elastic strain engineering” applications. |
Persistent Identifier | http://hdl.handle.net/10722/326110 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Zhang, Hongti | - |
dc.contributor.author | Tersoff, Jerry | - |
dc.contributor.author | Xu, Shang | - |
dc.contributor.author | Chen, Huixin | - |
dc.contributor.author | Zhang, Qiaobao | - |
dc.contributor.author | Zhang, Kaili | - |
dc.contributor.author | Yang, Yong | - |
dc.contributor.author | Lee, Chun Sing | - |
dc.contributor.author | Tu, King Ning | - |
dc.contributor.author | Li, Ju | - |
dc.contributor.author | Lu, Yang | - |
dc.date.accessioned | 2023-03-09T09:58:06Z | - |
dc.date.available | 2023-03-09T09:58:06Z | - |
dc.date.issued | 2016 | - |
dc.identifier.citation | Science Advances, 2016, v. 2, n. 8, article no. e1501382 | - |
dc.identifier.uri | http://hdl.handle.net/10722/326110 | - |
dc.description.abstract | Achieving high elasticity for silicon (Si) nanowires, one of the most important and versatile building blocks in nanoelectronics, would enable their application in flexible electronics and bio-nano interfaces. We show that vapor-liquid-solid–grown single-crystalline Si nanowires with diameters of ~100 nm can be repeatedly stretched above 10% elastic strain at room temperature, approaching the theoretical elastic limit of silicon (17 to 20%). A few samples even reached ~16% tensile strain, with estimated fracture stress up to ~20 GPa. The deformations were fully reversible and hysteresis-free under loading-unloading tests with varied strain rates, and the failures still occurred in brittle fracture, with no visible sign of plasticity. The ability to achieve this “deep ultra-strength” for Si nanowires can be attributed mainly to their pristine, defect-scarce, nanosized single-crystalline structure and atomically smooth surfaces. This result indicates that semiconductor nanowires could have ultra-large elasticity with tunable band structures for promising “elastic strain engineering” applications. | - |
dc.language | eng | - |
dc.relation.ispartof | Science Advances | - |
dc.title | Approaching the ideal elastic strain limit in silicon nanowires | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1126/sciadv.1501382 | - |
dc.identifier.pmid | 27540586 | - |
dc.identifier.scopus | eid_2-s2.0-84999847700 | - |
dc.identifier.volume | 2 | - |
dc.identifier.issue | 8 | - |
dc.identifier.spage | article no. e1501382 | - |
dc.identifier.epage | article no. e1501382 | - |
dc.identifier.eissn | 2375-2548 | - |
dc.identifier.isi | WOS:000383734300003 | - |