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Article: In situ atomic-scale analysis of Rayleigh instability in ultrathin gold nanowires

TitleIn situ atomic-scale analysis of Rayleigh instability in ultrathin gold nanowires
Authors
KeywordsIn situ transmission electron microscopy (TEM)
Interconnect
Rayleigh instability
Thermal instability
Ultrathin gold nanowire
Issue Date2018
Citation
Nano Research, 2018, v. 11, n. 2, p. 625-632 How to Cite?
AbstractComprehensive understanding of the structural/morphology stability of ultrathin (diameter < 10 nm) gold nanowires under real service conditions (such as under Joule heating) is a prerequisite for the reliable implementation of these emerging building blocks into functional nanoelectronics and mechatronics systems. Here, by using the in situ transmission electron microscopy (TEM) technique, we discovered that the Rayleigh instability phenomenon exists in ultrathin gold nanowires upon moderate heating. Through the controlled electron beam irradiation-induced heating mechanism (with < 100 °C temperature rise), we further quantified the effect of electron beam intensity and its dependence on Rayleigh instability in altering the geometry and morphology of the ultrathin gold nanowires. Moreover, in situ high-resolution TEM (HRTEM) observations revealed surface atomic diffusion process to be the dominating mechanism for the morphology evolution processes. Our results, with unprecedented details on the atomic-scale picture of Rayleigh instability and its underlying physics, provide critical insights on the thermal/structural stability of gold nanostructures down to a sub-10 nm level, which may pave the way for their interconnect applications in future ultra-large- scale integrated circuits.
Persistent Identifierhttp://hdl.handle.net/10722/326133
ISSN
2023 Impact Factor: 9.5
2023 SCImago Journal Rankings: 2.539
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorXu, Shang-
dc.contributor.authorLi, Peifeng-
dc.contributor.authorLu, Yang-
dc.date.accessioned2023-03-09T09:58:16Z-
dc.date.available2023-03-09T09:58:16Z-
dc.date.issued2018-
dc.identifier.citationNano Research, 2018, v. 11, n. 2, p. 625-632-
dc.identifier.issn1998-0124-
dc.identifier.urihttp://hdl.handle.net/10722/326133-
dc.description.abstractComprehensive understanding of the structural/morphology stability of ultrathin (diameter < 10 nm) gold nanowires under real service conditions (such as under Joule heating) is a prerequisite for the reliable implementation of these emerging building blocks into functional nanoelectronics and mechatronics systems. Here, by using the in situ transmission electron microscopy (TEM) technique, we discovered that the Rayleigh instability phenomenon exists in ultrathin gold nanowires upon moderate heating. Through the controlled electron beam irradiation-induced heating mechanism (with < 100 °C temperature rise), we further quantified the effect of electron beam intensity and its dependence on Rayleigh instability in altering the geometry and morphology of the ultrathin gold nanowires. Moreover, in situ high-resolution TEM (HRTEM) observations revealed surface atomic diffusion process to be the dominating mechanism for the morphology evolution processes. Our results, with unprecedented details on the atomic-scale picture of Rayleigh instability and its underlying physics, provide critical insights on the thermal/structural stability of gold nanostructures down to a sub-10 nm level, which may pave the way for their interconnect applications in future ultra-large- scale integrated circuits.-
dc.languageeng-
dc.relation.ispartofNano Research-
dc.subjectIn situ transmission electron microscopy (TEM)-
dc.subjectInterconnect-
dc.subjectRayleigh instability-
dc.subjectThermal instability-
dc.subjectUltrathin gold nanowire-
dc.titleIn situ atomic-scale analysis of Rayleigh instability in ultrathin gold nanowires-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1007/s12274-017-1667-3-
dc.identifier.scopuseid_2-s2.0-85028553076-
dc.identifier.volume11-
dc.identifier.issue2-
dc.identifier.spage625-
dc.identifier.epage632-
dc.identifier.eissn1998-0000-
dc.identifier.isiWOS:000419959500003-

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