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- Publisher Website: 10.1109/JMEMS.2010.2046014
- Scopus: eid_2-s2.0-77953122842
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Article: Development and application of a novel microfabricated device for the in situ tensile testing of 1-D nanomaterials
| Title | Development and application of a novel microfabricated device for the in situ tensile testing of 1-D nanomaterials |
|---|---|
| Authors | |
| Keywords | In situ Microdevices Nanoindenter Nanomanipulation Nanomechanics |
| Issue Date | 2010 |
| Citation | Journal of Microelectromechanical Systems, 2010, v. 19, n. 3, p. 675-682 How to Cite? |
| Abstract | We report on the development and application of a silicon microdevice for the in situ quantitative mechanical characterization of single 1-D nanomaterials within a scanning electron microscope equipped with a quantitative nanoindenter. The design makes it possible to convert a compressive nanoindentation force applied to a shuttle to uniaxial tension on a specimen attached to a sample stage. Finite-element analysis and experimental calibration have been employed to extract the specimen stress versus strain curve from the indentation load versus displacement curve. The stress versus strain curves for three 200300-nm-diameter Ni nanowire specimens are presented and analyzed. © 2010 IEEE. |
| Persistent Identifier | http://hdl.handle.net/10722/326399 |
| ISSN | 2021 Impact Factor: 2.829 2020 SCImago Journal Rankings: 0.596 |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ganesan, Yogeeswaran | - |
| dc.contributor.author | Lu, Yang | - |
| dc.contributor.author | Peng, Cheng | - |
| dc.contributor.author | Lu, Hao | - |
| dc.contributor.author | Ballarini, Roberto | - |
| dc.contributor.author | Lou, Jun | - |
| dc.date.accessioned | 2023-03-09T10:00:22Z | - |
| dc.date.available | 2023-03-09T10:00:22Z | - |
| dc.date.issued | 2010 | - |
| dc.identifier.citation | Journal of Microelectromechanical Systems, 2010, v. 19, n. 3, p. 675-682 | - |
| dc.identifier.issn | 1057-7157 | - |
| dc.identifier.uri | http://hdl.handle.net/10722/326399 | - |
| dc.description.abstract | We report on the development and application of a silicon microdevice for the in situ quantitative mechanical characterization of single 1-D nanomaterials within a scanning electron microscope equipped with a quantitative nanoindenter. The design makes it possible to convert a compressive nanoindentation force applied to a shuttle to uniaxial tension on a specimen attached to a sample stage. Finite-element analysis and experimental calibration have been employed to extract the specimen stress versus strain curve from the indentation load versus displacement curve. The stress versus strain curves for three 200300-nm-diameter Ni nanowire specimens are presented and analyzed. © 2010 IEEE. | - |
| dc.language | eng | - |
| dc.relation.ispartof | Journal of Microelectromechanical Systems | - |
| dc.subject | In situ | - |
| dc.subject | Microdevices | - |
| dc.subject | Nanoindenter | - |
| dc.subject | Nanomanipulation | - |
| dc.subject | Nanomechanics | - |
| dc.title | Development and application of a novel microfabricated device for the in situ tensile testing of 1-D nanomaterials | - |
| dc.type | Article | - |
| dc.description.nature | link_to_subscribed_fulltext | - |
| dc.identifier.doi | 10.1109/JMEMS.2010.2046014 | - |
| dc.identifier.scopus | eid_2-s2.0-77953122842 | - |
| dc.identifier.volume | 19 | - |
| dc.identifier.issue | 3 | - |
| dc.identifier.spage | 675 | - |
| dc.identifier.epage | 682 | - |