Electrical measurements of individual semiconducting single-walled carbon nanotubes of various diameters

Abstract

Individual semiconducting single-walled carbon nanotubes (SWNTs) of various diameters are studied by electrical measurements. Transport through a semiconducting SWNT involves thermal activation at high temperatures, and tunneling through a reverse biased metal-tube junction at low temperatures. Under high bias voltages, current-voltage (I-V) characteristics of semiconducting SWNTs exhibit pronounced asymmetry with respect to the bias polarity, as a result of local gating. SWNT transistors that mimic conventional p-metal-oxide-semiconductor field-effect transistor with similar I-V characteristics and high transconductance are enabled. © 2000 American Institute of Physics.