Erratum: Carbon nanotube tipped atomic force microscopy for measurement of &lt;100 nm etch morphology on semiconductors (Appl. Phys. Lett. (1998) 73 (529) (10.1063/1.122069))

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Title	Erratum: Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors (Appl. Phys. Lett. (1998) 73 (529) (10.1063/1.122069))
Authors	Nagy, G.Levy, M.Scarmozzino, R.Osgood, R. M.Dai, H.Smalley, R. E.Michaels, C. A.Sevy, E. T.Flynn, G. W.Mclane, G. F.
Issue Date	1998
Citation	Applied Physics Letters, 1998, v. 73, n. 10, p. 1448 How to Cite? DOI: http://dx.doi.org/10.1063/1.122171
Persistent Identifier	http://hdl.handle.net/10722/334029
ISSN	0003-6951 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID	WOS:000075786000047

DC Field	Value	Language
dc.contributor.author	Nagy, G.	-
dc.contributor.author	Levy, M.	-
dc.contributor.author	Scarmozzino, R.	-
dc.contributor.author	Osgood, R. M.	-
dc.contributor.author	Dai, H.	-
dc.contributor.author	Smalley, R. E.	-
dc.contributor.author	Michaels, C. A.	-
dc.contributor.author	Sevy, E. T.	-
dc.contributor.author	Flynn, G. W.	-
dc.contributor.author	Mclane, G. F.	-
dc.date.accessioned	2023-10-20T06:45:02Z	-
dc.date.available	2023-10-20T06:45:02Z	-
dc.date.issued	1998	-
dc.identifier.citation	Applied Physics Letters, 1998, v. 73, n. 10, p. 1448	-
dc.identifier.issn	0003-6951	-
dc.identifier.uri	http://hdl.handle.net/10722/334029	-
dc.language	eng	-
dc.relation.ispartof	Applied Physics Letters	-
dc.title	Erratum: Carbon nanotube tipped atomic force microscopy for measurement of <100 nm etch morphology on semiconductors (Appl. Phys. Lett. (1998) 73 (529) (10.1063/1.122069))	-
dc.type	Article	-
dc.description.nature	link_to_subscribed_fulltext	-
dc.identifier.doi	10.1063/1.122171	-
dc.identifier.scopus	eid_2-s2.0-0002673803	-
dc.identifier.volume	73	-
dc.identifier.issue	10	-
dc.identifier.spage	1448	-
dc.identifier.epage		-
dc.identifier.isi	WOS:000075786000047	-