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Article: Hierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging
Title | Hierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging |
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Authors | |
Issue Date | 2009 |
Citation | Nano Letters, 2009, v. 9, n. 11, p. 3762-3765 How to Cite? |
Abstract | Local electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant electronic inhomogeneity. For the conductive chemical graphene, the residual defects lead to a systematic reduction of the microwave signals. In contrast, the signals on pristine graphene agree well with a lumped-element circuit model. The local impedance information can also be used to verify the electrical contact between overlapped graphene pieces. © 2009 American Chemical Society. |
Persistent Identifier | http://hdl.handle.net/10722/334207 |
ISSN | 2023 Impact Factor: 9.6 2023 SCImago Journal Rankings: 3.411 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Kundhikanjana, Worasom | - |
dc.contributor.author | Lai, Keji | - |
dc.contributor.author | Wang, Hailiang | - |
dc.contributor.author | Dai, Hongjie | - |
dc.contributor.author | Kelly, Michael A. | - |
dc.contributor.author | Shen, Zhi Xun | - |
dc.date.accessioned | 2023-10-20T06:46:29Z | - |
dc.date.available | 2023-10-20T06:46:29Z | - |
dc.date.issued | 2009 | - |
dc.identifier.citation | Nano Letters, 2009, v. 9, n. 11, p. 3762-3765 | - |
dc.identifier.issn | 1530-6984 | - |
dc.identifier.uri | http://hdl.handle.net/10722/334207 | - |
dc.description.abstract | Local electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant electronic inhomogeneity. For the conductive chemical graphene, the residual defects lead to a systematic reduction of the microwave signals. In contrast, the signals on pristine graphene agree well with a lumped-element circuit model. The local impedance information can also be used to verify the electrical contact between overlapped graphene pieces. © 2009 American Chemical Society. | - |
dc.language | eng | - |
dc.relation.ispartof | Nano Letters | - |
dc.title | Hierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1021/nl901949z | - |
dc.identifier.scopus | eid_2-s2.0-72849132804 | - |
dc.identifier.volume | 9 | - |
dc.identifier.issue | 11 | - |
dc.identifier.spage | 3762 | - |
dc.identifier.epage | 3765 | - |
dc.identifier.isi | WOS:000271566400017 | - |