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Article: Hierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging

TitleHierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging
Authors
Issue Date2009
Citation
Nano Letters, 2009, v. 9, n. 11, p. 3762-3765 How to Cite?
AbstractLocal electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant electronic inhomogeneity. For the conductive chemical graphene, the residual defects lead to a systematic reduction of the microwave signals. In contrast, the signals on pristine graphene agree well with a lumped-element circuit model. The local impedance information can also be used to verify the electrical contact between overlapped graphene pieces. © 2009 American Chemical Society.
Persistent Identifierhttp://hdl.handle.net/10722/334207
ISSN
2023 Impact Factor: 9.6
2023 SCImago Journal Rankings: 3.411
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorKundhikanjana, Worasom-
dc.contributor.authorLai, Keji-
dc.contributor.authorWang, Hailiang-
dc.contributor.authorDai, Hongjie-
dc.contributor.authorKelly, Michael A.-
dc.contributor.authorShen, Zhi Xun-
dc.date.accessioned2023-10-20T06:46:29Z-
dc.date.available2023-10-20T06:46:29Z-
dc.date.issued2009-
dc.identifier.citationNano Letters, 2009, v. 9, n. 11, p. 3762-3765-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10722/334207-
dc.description.abstractLocal electrical imaging using microwave impedance microscope is performed on graphene in different modalities, yielding a rich hierarchy of the local conductivity. The low-conductivity graphite oxide and its derivatives show significant electronic inhomogeneity. For the conductive chemical graphene, the residual defects lead to a systematic reduction of the microwave signals. In contrast, the signals on pristine graphene agree well with a lumped-element circuit model. The local impedance information can also be used to verify the electrical contact between overlapped graphene pieces. © 2009 American Chemical Society.-
dc.languageeng-
dc.relation.ispartofNano Letters-
dc.titleHierarchy of electronic properties of chemically derived and pristine graphene probed by microwave imaging-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/nl901949z-
dc.identifier.scopuseid_2-s2.0-72849132804-
dc.identifier.volume9-
dc.identifier.issue11-
dc.identifier.spage3762-
dc.identifier.epage3765-
dc.identifier.isiWOS:000271566400017-

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