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postgraduate thesis: Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001)
| Title | Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001) |
|---|---|
| Authors | |
| Advisors | Advisor(s):Wu, HS |
| Issue Date | 2000 |
| Publisher | The University of Hong Kong (Pokfulam, Hong Kong) |
| Citation | Ng, T. V. [吳子傑]. (2000). Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001). (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122500 |
| Degree | Master of Philosophy |
| Subject | Silicon carbide Low energy electron diffraction. Surfaces (Physics) |
| Dept/Program | Physics |
| Persistent Identifier | http://hdl.handle.net/10722/33544 |
| HKU Library Item ID | b3122500 |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Wu, HS | - |
| dc.contributor.author | Ng, Tsz-kit, Victor. | - |
| dc.contributor.author | 吳子傑 | - |
| dc.date.issued | 2000 | - |
| dc.identifier.citation | Ng, T. V. [吳子傑]. (2000). Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001). (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3122500 | - |
| dc.identifier.uri | http://hdl.handle.net/10722/33544 | - |
| dc.language | eng | - |
| dc.publisher | The University of Hong Kong (Pokfulam, Hong Kong) | - |
| dc.relation.ispartof | HKU Theses Online (HKUTO) | - |
| dc.rights | The author retains all proprietary rights, (such as patent rights) and the right to use in future works. | - |
| dc.rights | This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License. | - |
| dc.source.uri | http://hub.hku.hk/bib/B31225007 | - |
| dc.subject.lcsh | Silicon carbide | - |
| dc.subject.lcsh | Low energy electron diffraction. | - |
| dc.subject.lcsh | Surfaces (Physics) | - |
| dc.title | Inversion of low energy electron diffraction IV spectra of reconstructed structure of SiC (0001) | - |
| dc.type | PG_Thesis | - |
| dc.identifier.hkul | b3122500 | - |
| dc.description.thesisname | Master of Philosophy | - |
| dc.description.thesislevel | Master | - |
| dc.description.thesisdiscipline | Physics | - |
| dc.description.nature | published_or_final_version | - |
| dc.identifier.doi | 10.5353/th_b3122500 | - |
| dc.date.hkucongregation | 2001 | - |
| dc.identifier.mmsid | 991012292069703414 | - |