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Article: Bayesian step stress accelerated degradation testing design: A multi-objective Pareto-optimal approach

TitleBayesian step stress accelerated degradation testing design: A multi-objective Pareto-optimal approach
Authors
KeywordsBayesian optimal design
DEA
Multi objective programming
NSGA II
Reliability
Step stress accelerated degradation testing
Issue Date2018
Citation
Reliability Engineering and System Safety, 2018, v. 171, p. 9-17 How to Cite?
AbstractStep-stress accelerated degradation testing (SSADT) aims to access the reliability of products in a short time. Bayesian optimal design provides an effective alternative to capture parameters uncertainty, which has been widely employed in SSADT design by optimizing specified utility objective. However, there exist several utility objectives in Bayesian SSADT design; for the engineers, it causes much difficulty to choose the right utility specification with the budget consideration. In this study the problem is formulated as a multi-objective model motivated by the concept of Pareto optimization, which involves three objectives of maximizing the Kullback-Leibler (KL) divergence, minimizing the quadratic loss function of p-quantile lifetime at usage condition, and minimizing the test cost, simultaneously, in which the product degradation path is described by an inverse Gaussian (IG) process. The formulated programming is solved by NSGA-II to generate the Pareto of optimal solutions, which are further optimally reduced to gain a pruned Pareto set by data envelopment analysis (DEA) for engineering practice. The effectiveness of the proposed methodologies and solution method are experimentally illustrated by electrical connector's SSADT.
Persistent Identifierhttp://hdl.handle.net/10722/336733
ISSN
2023 Impact Factor: 9.4
2023 SCImago Journal Rankings: 2.028
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLi, Xiaoyang-
dc.contributor.authorHu, Yuqing-
dc.contributor.authorZhou, Jiandong-
dc.contributor.authorLi, Xiang-
dc.contributor.authorKang, Rui-
dc.date.accessioned2024-02-29T06:56:09Z-
dc.date.available2024-02-29T06:56:09Z-
dc.date.issued2018-
dc.identifier.citationReliability Engineering and System Safety, 2018, v. 171, p. 9-17-
dc.identifier.issn0951-8320-
dc.identifier.urihttp://hdl.handle.net/10722/336733-
dc.description.abstractStep-stress accelerated degradation testing (SSADT) aims to access the reliability of products in a short time. Bayesian optimal design provides an effective alternative to capture parameters uncertainty, which has been widely employed in SSADT design by optimizing specified utility objective. However, there exist several utility objectives in Bayesian SSADT design; for the engineers, it causes much difficulty to choose the right utility specification with the budget consideration. In this study the problem is formulated as a multi-objective model motivated by the concept of Pareto optimization, which involves three objectives of maximizing the Kullback-Leibler (KL) divergence, minimizing the quadratic loss function of p-quantile lifetime at usage condition, and minimizing the test cost, simultaneously, in which the product degradation path is described by an inverse Gaussian (IG) process. The formulated programming is solved by NSGA-II to generate the Pareto of optimal solutions, which are further optimally reduced to gain a pruned Pareto set by data envelopment analysis (DEA) for engineering practice. The effectiveness of the proposed methodologies and solution method are experimentally illustrated by electrical connector's SSADT.-
dc.languageeng-
dc.relation.ispartofReliability Engineering and System Safety-
dc.subjectBayesian optimal design-
dc.subjectDEA-
dc.subjectMulti objective programming-
dc.subjectNSGA II-
dc.subjectReliability-
dc.subjectStep stress accelerated degradation testing-
dc.titleBayesian step stress accelerated degradation testing design: A multi-objective Pareto-optimal approach-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.ress.2017.11.005-
dc.identifier.scopuseid_2-s2.0-85035355005-
dc.identifier.volume171-
dc.identifier.spage9-
dc.identifier.epage17-
dc.identifier.isiWOS:000423895300002-

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