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Article: Electronegative metal dopants improve switching variability in Al2O3 resistive switching devices

TitleElectronegative metal dopants improve switching variability in Al2O3 resistive switching devices
Authors
Issue Date19-Oct-2022
PublisherAmerican Physical Society
Citation
Physical Review Materials, 2022, v. 6, n. 10 How to Cite?
Abstract

Resistive random-access memories are promising for nonvolatile memory and brain-inspired computing applications. High variability and low yield of these devices are key drawbacks hindering reliable training of physical neural networks. In this paper, we show that doping an oxide electrolyte, Al2O3, with electronegative metals makes resistive switching significantly more reproducible, surpassing the reproducibility requirements for obtaining reliable hardware neuromorphic circuits. Based on density functional theory calculations, the underlying mechanism is hypothesized to be the ease of creating oxygen vacancies in the vicinity of electronegative dopants due to the capture of the associated electrons by dopant midgap states and the weakening of Al-O bonds. These oxygen vacancies and vacancy clusters also bind significantly to the dopant, thereby serving as preferential sites and building blocks in the formation of conducting paths. We validate this theory experimentally by implanting different dopants over a range of electronegativities in devices made of multiple alternating layers of Al2O3 and WN and find superior repeatability and yield with highly electronegative metals, Au, Pt, and Pd. These devices also exhibit a gradual SET transition, enabling multibit switching that is desirable for analog computing.


Persistent Identifierhttp://hdl.handle.net/10722/338754
ISSN
2023 Impact Factor: 3.1
2023 SCImago Journal Rankings: 0.932
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorTan, Zheng Jie-
dc.contributor.authorSomjit, Vrindaa-
dc.contributor.authorToparli, Cigdem-
dc.contributor.authorYildiz, Bilge-
dc.contributor.authorFang, Nicholas-
dc.date.accessioned2024-03-11T10:31:17Z-
dc.date.available2024-03-11T10:31:17Z-
dc.date.issued2022-10-19-
dc.identifier.citationPhysical Review Materials, 2022, v. 6, n. 10-
dc.identifier.issn2475-9953-
dc.identifier.urihttp://hdl.handle.net/10722/338754-
dc.description.abstract<p>Resistive random-access memories are promising for nonvolatile memory and brain-inspired computing applications. High variability and low yield of these devices are key drawbacks hindering reliable training of physical neural networks. In this paper, we show that doping an oxide electrolyte, Al2O3, with electronegative metals makes resistive switching significantly more reproducible, surpassing the reproducibility requirements for obtaining reliable hardware neuromorphic circuits. Based on density functional theory calculations, the underlying mechanism is hypothesized to be the ease of creating oxygen vacancies in the vicinity of electronegative dopants due to the capture of the associated electrons by dopant midgap states and the weakening of Al-O bonds. These oxygen vacancies and vacancy clusters also bind significantly to the dopant, thereby serving as preferential sites and building blocks in the formation of conducting paths. We validate this theory experimentally by implanting different dopants over a range of electronegativities in devices made of multiple alternating layers of Al2O3 and WN and find superior repeatability and yield with highly electronegative metals, Au, Pt, and Pd. These devices also exhibit a gradual SET transition, enabling multibit switching that is desirable for analog computing.<br></p>-
dc.languageeng-
dc.publisherAmerican Physical Society-
dc.relation.ispartofPhysical Review Materials-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleElectronegative metal dopants improve switching variability in Al2O3 resistive switching devices-
dc.typeArticle-
dc.identifier.doi10.1103/PhysRevMaterials.6.105002-
dc.identifier.scopuseid_2-s2.0-85141665041-
dc.identifier.volume6-
dc.identifier.issue10-
dc.identifier.isiWOS:000896513100003-
dc.identifier.issnl2475-9953-

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