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- Publisher Website: 10.1038/micronano.2016.24
- Scopus: eid_2-s2.0-85030331644
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Article: Recent advances in nanorobotic manipulation inside scanning electron microscopes
Title | Recent advances in nanorobotic manipulation inside scanning electron microscopes |
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Authors | |
Keywords | Automated nanomanipulation Scanning electron microscope SEM-based nanomanipulation |
Issue Date | 2016 |
Citation | Microsystems and Nanoengineering, 2016, v. 2, article no. 16024 How to Cite? |
Abstract | A scanning electron microscope (SEM) provides real-time imaging with nanometer resolution and a large scanning area, which enables the development and integration of robotic nanomanipulation systems inside a vacuum chamber to realize simultaneous imaging and direct interactions with nanoscaled samples. Emerging techniques for nanorobotic manipulation during SEM imaging enable the characterization of nanomaterials and nanostructures and the prototyping/assembly of nanodevices. This paper presents a comprehensive survey of recent advances in nanorobotic manipulation, including the development of nanomanipulation platforms, tools, changeable toolboxes, sensing units, control strategies, electron beam-induced deposition approaches, automation techniques, and nanomanipulation-enabled applications and discoveries. The limitations of the existing technologies and prospects for new technologies are also discussed. |
Persistent Identifier | http://hdl.handle.net/10722/348871 |
DC Field | Value | Language |
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dc.contributor.author | Shi, Chaoyang | - |
dc.contributor.author | Luu, Devin K. | - |
dc.contributor.author | Yang, Qinmin | - |
dc.contributor.author | Liu, Jun | - |
dc.contributor.author | Chen, Jun | - |
dc.contributor.author | Ru, Changhai | - |
dc.contributor.author | Xie, Shaorong | - |
dc.contributor.author | Luo, Jun | - |
dc.contributor.author | Ge, Ji | - |
dc.contributor.author | Sun, Yu | - |
dc.date.accessioned | 2024-10-17T06:54:38Z | - |
dc.date.available | 2024-10-17T06:54:38Z | - |
dc.date.issued | 2016 | - |
dc.identifier.citation | Microsystems and Nanoengineering, 2016, v. 2, article no. 16024 | - |
dc.identifier.uri | http://hdl.handle.net/10722/348871 | - |
dc.description.abstract | A scanning electron microscope (SEM) provides real-time imaging with nanometer resolution and a large scanning area, which enables the development and integration of robotic nanomanipulation systems inside a vacuum chamber to realize simultaneous imaging and direct interactions with nanoscaled samples. Emerging techniques for nanorobotic manipulation during SEM imaging enable the characterization of nanomaterials and nanostructures and the prototyping/assembly of nanodevices. This paper presents a comprehensive survey of recent advances in nanorobotic manipulation, including the development of nanomanipulation platforms, tools, changeable toolboxes, sensing units, control strategies, electron beam-induced deposition approaches, automation techniques, and nanomanipulation-enabled applications and discoveries. The limitations of the existing technologies and prospects for new technologies are also discussed. | - |
dc.language | eng | - |
dc.relation.ispartof | Microsystems and Nanoengineering | - |
dc.subject | Automated nanomanipulation | - |
dc.subject | Scanning electron microscope | - |
dc.subject | SEM-based nanomanipulation | - |
dc.title | Recent advances in nanorobotic manipulation inside scanning electron microscopes | - |
dc.type | Article | - |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1038/micronano.2016.24 | - |
dc.identifier.scopus | eid_2-s2.0-85030331644 | - |
dc.identifier.volume | 2 | - |
dc.identifier.spage | article no. 16024 | - |
dc.identifier.epage | article no. 16024 | - |
dc.identifier.eissn | 2055-7434 | - |