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Article: In situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope

TitleIn situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope
Authors
Golberg, D.Mitome, M.Kurashima, K.Zhi, C. Y.Tang, C. C.Bando, Y.Lourie, O.
Issue Date2006
Citation
Applied Physics Letters, 2006, v. 88, n. 12, article no. 123101 How to Cite?
DOI: http://dx.doi.org/10.1063/1.2186987
AbstractBoron nitride nanotubes filled with magnesium oxides [MgO, MgO 2] and/or hydroxide [Mg(OH) 2] are electrically probed and delicately manipulated inside a 300 kV JEOL-3000F high-resolution transmission analytical electron microscope equipped with a side-entry "Nanofactory Instruments" piezoholder. At a low bias the nanotubes demonstrate truly insulating behavior. At a high bias of ±30 V they show reversible breakdown current of several dozens of nA. Under 300 kV electron beam irradiation the nanotubes are positively charged that allows us to perform on-demand manipulation with them through tuning of polarity and/or value of a bias voltage on a gold counterelectrode from -140 to +140 V, owing to the prominent electrostatic nanotube-electrode interactions. © 2006 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/359831
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976

 

DC FieldValueLanguage
dc.contributor.authorGolberg, D.-
dc.contributor.authorMitome, M.-
dc.contributor.authorKurashima, K.-
dc.contributor.authorZhi, C. Y.-
dc.contributor.authorTang, C. C.-
dc.contributor.authorBando, Y.-
dc.contributor.authorLourie, O.-
dc.date.accessioned2025-09-10T09:03:34Z-
dc.date.available2025-09-10T09:03:34Z-
dc.date.issued2006-
dc.identifier.citationApplied Physics Letters, 2006, v. 88, n. 12, article no. 123101-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/359831-
dc.description.abstractBoron nitride nanotubes filled with magnesium oxides [MgO, MgO <inf>2</inf>] and/or hydroxide [Mg(OH) <inf>2</inf>] are electrically probed and delicately manipulated inside a 300 kV JEOL-3000F high-resolution transmission analytical electron microscope equipped with a side-entry "Nanofactory Instruments" piezoholder. At a low bias the nanotubes demonstrate truly insulating behavior. At a high bias of ±30 V they show reversible breakdown current of several dozens of nA. Under 300 kV electron beam irradiation the nanotubes are positively charged that allows us to perform on-demand manipulation with them through tuning of polarity and/or value of a bias voltage on a gold counterelectrode from -140 to +140 V, owing to the prominent electrostatic nanotube-electrode interactions. © 2006 American Institute of Physics.-
dc.languageeng-
dc.relation.ispartofApplied Physics Letters-
dc.titleIn situ electrical probing and bias-mediated manipulation of dielectric nanotubes in a high-resolution transmission electron microscope-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1063/1.2186987-
dc.identifier.scopuseid_2-s2.0-33645524157-
dc.identifier.volume88-
dc.identifier.issue12-
dc.identifier.spagearticle no. 123101-
dc.identifier.epagearticle no. 123101-

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