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Article: In situ TEM Measurements of Nanotube and Nanosheet Properties

TitleIn situ TEM Measurements of Nanotube and Nanosheet Properties
Authors
Golberg, D.Costa, P. J.Tang, D.Ren, C.Wei, X.Yamaguchi, M.Kawamoto, N.Mitome, M.Zhi, C.Liu, C.Bando, Y.
Issue Date2012
Citation
Microscopy and Microanalysis, 2012, v. 18, n. S2, p. 1542-1543 How to Cite?
DOI: http://dx.doi.org/10.1017/S1431927612009567
Persistent Identifierhttp://hdl.handle.net/10722/359970
ISSN
1431-9276
2023 Impact Factor: 2.9
2023 SCImago Journal Rankings: 0.387

 

DC FieldValueLanguage
dc.contributor.authorGolberg, D.-
dc.contributor.authorCosta, P. J.-
dc.contributor.authorTang, D.-
dc.contributor.authorRen, C.-
dc.contributor.authorWei, X.-
dc.contributor.authorYamaguchi, M.-
dc.contributor.authorKawamoto, N.-
dc.contributor.authorMitome, M.-
dc.contributor.authorZhi, C.-
dc.contributor.authorLiu, C.-
dc.contributor.authorBando, Y.-
dc.date.accessioned2025-09-10T09:04:16Z-
dc.date.available2025-09-10T09:04:16Z-
dc.date.issued2012-
dc.identifier.citationMicroscopy and Microanalysis, 2012, v. 18, n. S2, p. 1542-1543-
dc.identifier.issn1431-9276-
dc.identifier.urihttp://hdl.handle.net/10722/359970-
dc.languageeng-
dc.relation.ispartofMicroscopy and Microanalysis-
dc.titleIn situ TEM Measurements of Nanotube and Nanosheet Properties-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1017/S1431927612009567-
dc.identifier.scopuseid_2-s2.0-85009569558-
dc.identifier.volume18-
dc.identifier.issueS2-
dc.identifier.spage1542-
dc.identifier.epage1543-
dc.identifier.eissn1435-8115-

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