File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Direct force measurements and kinking under elastic deformation of individual multiwalled boron nitride nanotubes

TitleDirect force measurements and kinking under elastic deformation of individual multiwalled boron nitride nanotubes
Authors
Issue Date2007
Citation
Nano Letters, 2007, v. 7, n. 7, p. 2146-2151 How to Cite?
AbstractIndividual multiwalled boron nitride nanotubes of different diameters (40-100 nm) were bent inside a 300 kV high-resolution transmission electron microscope (TEM) using a new fully integrated TEM-atomic force microscope (AFM) piezodriven holder under continuous recording of force-piezodisplacement curves. The tubes were gently compressed in situ (i.e., inside the electron microscope) between a piezomovable aluminum wire and a silicon cantilever. Typically, bending stress values ranging from ∼100 to ∼260 MPa, and corresponding to elastic moduli of 0.5-0.6 TPa, were estimated. Tube gross failures were absent up to very large bending angles (in excess of 115°). Extending the bending angles beyond 30-40° resulted in the elastic deformation of BN nanotubes, which proceeded through the propagation of consecutive momentary kinks. These had the effect of accumulating a bending curvature rather then uniformly curl the tube under the compression load. These kinks were found to be entirely reversible on reloading with no (or marginal) traces of residual plastic deformation. © 2007 American Chemical Society.
Persistent Identifierhttp://hdl.handle.net/10722/360430
ISSN
2023 Impact Factor: 9.6
2023 SCImago Journal Rankings: 3.411

 

DC FieldValueLanguage
dc.contributor.authorGolberg, Dmitri-
dc.contributor.authorCosta, Pedro M.F.J.-
dc.contributor.authorLourie, Oleg-
dc.contributor.authorMitome, Masanori-
dc.contributor.authorBai, Xuedong-
dc.contributor.authorKurashima, Keiji-
dc.contributor.authorZhi, Chunyi-
dc.contributor.authorTang, Chengchun-
dc.contributor.authorBando, Yoshio-
dc.date.accessioned2025-09-10T09:06:47Z-
dc.date.available2025-09-10T09:06:47Z-
dc.date.issued2007-
dc.identifier.citationNano Letters, 2007, v. 7, n. 7, p. 2146-2151-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10722/360430-
dc.description.abstractIndividual multiwalled boron nitride nanotubes of different diameters (40-100 nm) were bent inside a 300 kV high-resolution transmission electron microscope (TEM) using a new fully integrated TEM-atomic force microscope (AFM) piezodriven holder under continuous recording of force-piezodisplacement curves. The tubes were gently compressed in situ (i.e., inside the electron microscope) between a piezomovable aluminum wire and a silicon cantilever. Typically, bending stress values ranging from ∼100 to ∼260 MPa, and corresponding to elastic moduli of 0.5-0.6 TPa, were estimated. Tube gross failures were absent up to very large bending angles (in excess of 115°). Extending the bending angles beyond 30-40° resulted in the elastic deformation of BN nanotubes, which proceeded through the propagation of consecutive momentary kinks. These had the effect of accumulating a bending curvature rather then uniformly curl the tube under the compression load. These kinks were found to be entirely reversible on reloading with no (or marginal) traces of residual plastic deformation. © 2007 American Chemical Society.-
dc.languageeng-
dc.relation.ispartofNano Letters-
dc.titleDirect force measurements and kinking under elastic deformation of individual multiwalled boron nitride nanotubes-
dc.typeArticle-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/nl070863r-
dc.identifier.scopuseid_2-s2.0-34547599729-
dc.identifier.volume7-
dc.identifier.issue7-
dc.identifier.spage2146-
dc.identifier.epage2151-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats