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- Publisher Website: 10.1515/nanoph-2021-0276
- Scopus: eid_2-s2.0-85112259707
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Article: Onset of charge interaction in strong-field photoemission from nanometric needle tips
| Title | Onset of charge interaction in strong-field photoemission from nanometric needle tips |
|---|---|
| Authors | |
| Keywords | charge interactions nanometric needle tips strong-field nanophysics |
| Issue Date | 2021 |
| Citation | Nanophotonics, 2021, v. 10, n. 14, p. 3769-3775 How to Cite? |
| Abstract | Strong-field photoemission from nanostructures and the associated temporally modulated currents play a key role in the development of ultrafast vacuum optoelectronics. Optical light fields could push their operation bandwidth into the petahertz domain. A critical aspect of their functionality in the context of applications is the impact of charge interaction effects. Here, we investigated the photoemission and photocurrents from nanometric tungsten needle tips exposed to carrier-envelope phase (CEP)-controlled few-cycle laser fields. We report a characteristic rapid increase in the intensity-rescaled cutoff energies of emitted electrons beyond a certain intensity value. By comparison with simulations, we identify this feature as the onset of charge-interaction dominated photoemission dynamics. Our results are anticipated to be relevant also for the strong-field photoemission from other nanostructures, including photoemission from plasmonic nanobowtie antennas used in CEP-detection and for PHz-scale devices. |
| Persistent Identifier | http://hdl.handle.net/10722/364461 |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Schötz, Johannes | - |
| dc.contributor.author | Seiffert, Lennart | - |
| dc.contributor.author | Maliakkal, Ancyline | - |
| dc.contributor.author | Blöchl, Johannes | - |
| dc.contributor.author | Zimin, Dmitry | - |
| dc.contributor.author | Rosenberger, Philipp | - |
| dc.contributor.author | Bergues, Boris | - |
| dc.contributor.author | Hommelhoff, Peter | - |
| dc.contributor.author | Krausz, Ferenc | - |
| dc.contributor.author | Fennel, Thomas | - |
| dc.contributor.author | Kling, Matthias F. | - |
| dc.date.accessioned | 2025-10-30T08:33:53Z | - |
| dc.date.available | 2025-10-30T08:33:53Z | - |
| dc.date.issued | 2021 | - |
| dc.identifier.citation | Nanophotonics, 2021, v. 10, n. 14, p. 3769-3775 | - |
| dc.identifier.uri | http://hdl.handle.net/10722/364461 | - |
| dc.description.abstract | Strong-field photoemission from nanostructures and the associated temporally modulated currents play a key role in the development of ultrafast vacuum optoelectronics. Optical light fields could push their operation bandwidth into the petahertz domain. A critical aspect of their functionality in the context of applications is the impact of charge interaction effects. Here, we investigated the photoemission and photocurrents from nanometric tungsten needle tips exposed to carrier-envelope phase (CEP)-controlled few-cycle laser fields. We report a characteristic rapid increase in the intensity-rescaled cutoff energies of emitted electrons beyond a certain intensity value. By comparison with simulations, we identify this feature as the onset of charge-interaction dominated photoemission dynamics. Our results are anticipated to be relevant also for the strong-field photoemission from other nanostructures, including photoemission from plasmonic nanobowtie antennas used in CEP-detection and for PHz-scale devices. | - |
| dc.language | eng | - |
| dc.relation.ispartof | Nanophotonics | - |
| dc.subject | charge interactions | - |
| dc.subject | nanometric needle tips | - |
| dc.subject | strong-field nanophysics | - |
| dc.title | Onset of charge interaction in strong-field photoemission from nanometric needle tips | - |
| dc.type | Article | - |
| dc.description.nature | link_to_subscribed_fulltext | - |
| dc.identifier.doi | 10.1515/nanoph-2021-0276 | - |
| dc.identifier.scopus | eid_2-s2.0-85112259707 | - |
| dc.identifier.volume | 10 | - |
| dc.identifier.issue | 14 | - |
| dc.identifier.spage | 3769 | - |
| dc.identifier.epage | 3775 | - |
| dc.identifier.eissn | 2192-8614 | - |
