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Article: High-Tc ramp-type Josephson junctions with a continually graded Y1–xPrxBa2Cu3Oy barrier

TitleHigh-Tc ramp-type Josephson junctions with a continually graded Y1–xPrxBa2Cu3Oy barrier
Authors
Gao, JSun, JLSo, SMTang, WHLi, TK
KeywordsPhysics engineering
Issue Date2001
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2001, v. 79 n. 19, p. 3101-3103 How to Cite?
DOI: http://dx.doi.org/10.1063/1.1414295
AbstractHigh-Tc Josephson junctions with a graded barrier have been prepared by using a composite target. Such a barrier is synthesized by utilizing Y1–xPrxBa2Cu3Oy with a continually graded concentration of Pr, in which no lattice mismatch and other incompatible problems take place. The structural interfaces are absent in the weak link region and Josephson coupling occurs at the naturally formed superconducting/normal interfaces within the Y1–xPrxBa2Cu3Oy layer. Thus, it can significantly enhance the reproducibilty and performance of these junctions. The temperature dependences of the barrier thickness and Josephson were also studied. © 2001 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/42202
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000171896600029

 

DC FieldValueLanguage
dc.contributor.authorGao, Jen_HK
dc.contributor.authorSun, JLen_HK
dc.contributor.authorSo, SMen_HK
dc.contributor.authorTang, WHen_HK
dc.contributor.authorLi, TKen_HK
dc.date.accessioned2007-01-08T02:31:32Z-
dc.date.available2007-01-08T02:31:32Z-
dc.date.issued2001en_HK
dc.identifier.citationApplied Physics Letters, 2001, v. 79 n. 19, p. 3101-3103-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/42202-
dc.description.abstractHigh-Tc Josephson junctions with a graded barrier have been prepared by using a composite target. Such a barrier is synthesized by utilizing Y1–xPrxBa2Cu3Oy with a continually graded concentration of Pr, in which no lattice mismatch and other incompatible problems take place. The structural interfaces are absent in the weak link region and Josephson coupling occurs at the naturally formed superconducting/normal interfaces within the Y1–xPrxBa2Cu3Oy layer. Thus, it can significantly enhance the reproducibilty and performance of these junctions. The temperature dependences of the barrier thickness and Josephson were also studied. © 2001 American Institute of Physics.en_HK
dc.format.extent81787 bytes-
dc.format.extent324489 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeimage/jpeg-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Letters-
dc.rightsCopyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2001, v. 79 n. 19, p. 3101-3103 and may be found at https://doi.org/10.1063/1.1414295-
dc.subjectPhysics engineeringen_HK
dc.titleHigh-Tc ramp-type Josephson junctions with a continually graded Y1–xPrxBa2Cu3Oy barrieren_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=79&issue=19&spage=3101&epage=3103&date=2001&atitle=High-Tc+ramp-type+Josephson+junctions+with+a+continually+graded+Y1–xPrxBa2Cu3Oy+barrieren_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.1414295en_HK
dc.identifier.scopuseid_2-s2.0-0012285032-
dc.identifier.volume79-
dc.identifier.issue19-
dc.identifier.spage3101-
dc.identifier.epage3103-
dc.identifier.isiWOS:000171896600029-
dc.identifier.issnl0003-6951-

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