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Article: Strain distribution in epitaxial SrTiO3 thin films

TitleStrain distribution in epitaxial SrTiO3 thin films
Authors
Zhai, ZYWu, XSJiang, ZSHao, JHGao, JCai, YFPan, YG
KeywordsPhysics Engineering
Issue Date2006
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2006, v. 89 n. 26, article no. 262902, p. 1-3 How to Cite?
DOI: http://dx.doi.org/10.1063/1.2424282
AbstractThe lattice strain distributions of epitaxial SrTiO3 films deposited on LaAlO3 were investigated by in situ x-ray diffraction at the temperature range of 25-300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO3 was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO3 films includes the surface layer, strained layer, and interface layer.
Persistent Identifierhttp://hdl.handle.net/10722/45262
ISSN
0003-6951
2021 Impact Factor: 3.971
2020 SCImago Journal Rankings: 1.182
ISI Accession Number ID
WOS:000243157600075

 

DC FieldValueLanguage
dc.contributor.authorZhai, ZYen_HK
dc.contributor.authorWu, XSen_HK
dc.contributor.authorJiang, ZSen_HK
dc.contributor.authorHao, JHen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorCai, YFen_HK
dc.contributor.authorPan, YGen_HK
dc.date.accessioned2007-10-30T06:21:15Z-
dc.date.available2007-10-30T06:21:15Z-
dc.date.issued2006en_HK
dc.identifier.citationApplied Physics Letters, 2006, v. 89 n. 26, article no. 262902, p. 1-3-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/45262-
dc.description.abstractThe lattice strain distributions of epitaxial SrTiO3 films deposited on LaAlO3 were investigated by in situ x-ray diffraction at the temperature range of 25-300 K, grazing incident x-ray diffraction, and high resolution x-ray diffraction. The nearly linear temperature dependence of the out-of-plane lattice constant of SrTiO3 was observed in the measured temperature range. The depth distribution of the lattice strain at room temperature for SrTiO3 films includes the surface layer, strained layer, and interface layer.en_HK
dc.format.extent78488 bytes-
dc.format.extent1963 bytes-
dc.format.extent4892 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypetext/plain-
dc.format.mimetypetext/plain-
dc.languageengen_HK
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Letters-
dc.rightsCopyright 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2006, v. 89 n. 26, article no. 262902, p. 1-3 and may be found at https://doi.org/10.1063/1.2424282-
dc.subjectPhysics Engineeringen_HK
dc.titleStrain distribution in epitaxial SrTiO3 thin filmsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=89&issue=26&spage=262902:1&epage=3&date=2006&atitle=Strain+distribution+in+epitaxial+SrTiO3+thin+filmsen_HK
dc.description.naturepublished_or_final_versionen_HK
dc.identifier.doi10.1063/1.2424282en_HK
dc.identifier.scopuseid_2-s2.0-33846044845-
dc.identifier.volume89-
dc.identifier.issue26-
dc.identifier.spagearticle no. 262902, p. 1-
dc.identifier.epagearticle no. 262902, p. 3-
dc.identifier.isiWOS:000243157600075-
dc.identifier.issnl0003-6951-

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