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Article: A micro-mechanics model for imperfect interface in dielectric materials

TitleA micro-mechanics model for imperfect interface in dielectric materials
Authors
Fan, HSze, KY
KeywordsCrack
Dielectric material
Interface
Self-consistent scheme
Issue Date2001
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/mechmat
Citation
Mechanics Of Materials, 2001, v. 33 n. 6, p. 363-370 How to Cite?
DOI: http://dx.doi.org/10.1016/S0167-6636(01)00053-9
AbstractThe interface between two dielectric bodies is considered imperfect if there are defects (micro-voids and micro-cracks) present on the interface. For such interface, the perfect continuity condition across the interface is no longer valid and its use in analysis becomes questionable. To account for this imperfection, we propose a micro-mechanics model based on the self-consistent scheme, leading to the establishment of a constitutive relationship between the electric displacement and potential discontinuity across the imperfect interface. © 2001 Elsevier Science Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/54316
ISSN
0167-6636
2023 Impact Factor: 3.4
2023 SCImago Journal Rankings: 0.948
ISI Accession Number ID
WOS:000169269900004
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorFan, Hen_HK
dc.contributor.authorSze, KYen_HK
dc.date.accessioned2009-04-03T07:43:03Z-
dc.date.available2009-04-03T07:43:03Z-
dc.date.issued2001en_HK
dc.identifier.citationMechanics Of Materials, 2001, v. 33 n. 6, p. 363-370en_HK
dc.identifier.issn0167-6636en_HK
dc.identifier.urihttp://hdl.handle.net/10722/54316-
dc.description.abstractThe interface between two dielectric bodies is considered imperfect if there are defects (micro-voids and micro-cracks) present on the interface. For such interface, the perfect continuity condition across the interface is no longer valid and its use in analysis becomes questionable. To account for this imperfection, we propose a micro-mechanics model based on the self-consistent scheme, leading to the establishment of a constitutive relationship between the electric displacement and potential discontinuity across the imperfect interface. © 2001 Elsevier Science Ltd.en_HK
dc.languageengen_HK
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/mechmaten_HK
dc.relation.ispartofMechanics of Materialsen_HK
dc.rightsMechanics of Materials. Copyright © Elsevier BV.en_HK
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.subjectCracken_HK
dc.subjectDielectric materialen_HK
dc.subjectInterfaceen_HK
dc.subjectSelf-consistent schemeen_HK
dc.titleA micro-mechanics model for imperfect interface in dielectric materialsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0167-6636&volume=33&issue=6&spage=363&epage=370&date=2001&atitle=A+micro-mechanics+model+for+imperfect+interface+in+dielectric+materialsen_HK
dc.identifier.emailSze, KY:szeky@graduate.hku.hken_HK
dc.identifier.authoritySze, KY=rp00171en_HK
dc.description.naturepostprinten_HK
dc.identifier.doi10.1016/S0167-6636(01)00053-9en_HK
dc.identifier.scopuseid_2-s2.0-0035371307en_HK
dc.identifier.hkuros60026-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035371307&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume33en_HK
dc.identifier.issue6en_HK
dc.identifier.spage363en_HK
dc.identifier.epage370en_HK
dc.identifier.isiWOS:000169269900004-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridFan, H=7402553644en_HK
dc.identifier.scopusauthoridSze, KY=7006735060en_HK
dc.identifier.issnl0167-6636-

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