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Conference Paper: A Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope

TitleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope
Authors
Tang, BNgan, AHW
Issue Date2009
PublisherMaterials Research Society of Singapore.
Citation
International Conference On Materials For Advanced Technologies (icmat) 2009, Singapore, 28 June-3 July 2009, p. 270 Abstract no. U-S9.4(O) A01476-02558 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/62284

 

DC FieldValueLanguage
dc.contributor.authorTang, B-
dc.contributor.authorNgan, AHW-
dc.date.accessioned2010-07-13T03:57:52Z-
dc.date.available2010-07-13T03:57:52Z-
dc.date.issued2009-
dc.identifier.citationInternational Conference On Materials For Advanced Technologies (icmat) 2009, Singapore, 28 June-3 July 2009, p. 270 Abstract no. U-S9.4(O) A01476-02558-
dc.identifier.urihttp://hdl.handle.net/10722/62284-
dc.languageeng-
dc.publisherMaterials Research Society of Singapore.-
dc.relation.ispartofTechnical Program of ICMAT 2009-
dc.titleA Novel Scheme For Quantitative Measurement Of The Elastic Modulus Of Materials At Nanoscale Using Atomic Force Microscope-
dc.typeConference_Paper-
dc.identifier.emailTang, B: tangbin@hkucc.hku.hk-
dc.identifier.emailNgan, AHW: hwngan@hkucc.hku.hk-
dc.identifier.authorityTang, B=rp00081-
dc.identifier.authorityNgan, AHW=rp00225-
dc.identifier.hkuros160611-
dc.identifier.spage270 Abstract no. U-S9.4(O) A01476-02558-
dc.identifier.epage270 Abstract no. U-S9.4(O) A01476-02558-
dc.publisher.placeSingapore-

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