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Conference Paper: How well do test case prioritization techniques support statistical fault localization

TitleHow well do test case prioritization techniques support statistical fault localization
Authors
KeywordsContinuous integration
Fault localization
Software process integration
Test case prioritization
Issue Date2009
PublisherIEEE. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143
Citation
Proceedings - International Computer Software And Applications Conference, 2009, v. 1, p. 99-106 How to Cite?
AbstractIn continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more effectively. Statistical fault-localization techniques use the execution information collected during testing to locate faults. Executing a small fraction of a prioritized test suite reduces the cost of testing, and yet the subsequent fault localization may suffer. This paper presents the first empirical study to examine the impact of test case prioritization on the effectiveness of fault localization. Among many interesting empirical results, we find that coverage-based techniques and random ordering can be more effective than distribution-based techniques in supporting statistical fault localization. Furthermore, the integration of random ordering for test case prioritization and statistical fault localization can be effective in locating faults quickly and economically. © 2009 IEEE.
DescriptionProceedings of IEEE Annual International Computer Software and Applications Conference.
This paper receives Best Paper Award from COMPSAC 2009. This research is supported in part by the General Research Fund of the Research Grants Council of Hong Kong
Persistent Identifierhttp://hdl.handle.net/10722/65463
ISSN
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorJiang, Ben_HK
dc.contributor.authorZhang, Zen_HK
dc.contributor.authorTse, THen_HK
dc.contributor.authorChen, TYen_HK
dc.date.accessioned2010-08-09T08:20:01Z-
dc.date.available2010-08-09T08:20:01Z-
dc.date.issued2009en_HK
dc.identifier.citationProceedings - International Computer Software And Applications Conference, 2009, v. 1, p. 99-106en_HK
dc.identifier.issn0730-3157en_HK
dc.identifier.urihttp://hdl.handle.net/10722/65463-
dc.descriptionProceedings of IEEE Annual International Computer Software and Applications Conference.-
dc.descriptionThis paper receives Best Paper Award from COMPSAC 2009. This research is supported in part by the General Research Fund of the Research Grants Council of Hong Kong-
dc.description.abstractIn continuous integration, a tight integration of test case prioritization techniques and fault-localization techniques may both expose failures faster and locate faults more effectively. Statistical fault-localization techniques use the execution information collected during testing to locate faults. Executing a small fraction of a prioritized test suite reduces the cost of testing, and yet the subsequent fault localization may suffer. This paper presents the first empirical study to examine the impact of test case prioritization on the effectiveness of fault localization. Among many interesting empirical results, we find that coverage-based techniques and random ordering can be more effective than distribution-based techniques in supporting statistical fault localization. Furthermore, the integration of random ordering for test case prioritization and statistical fault localization can be effective in locating faults quickly and economically. © 2009 IEEE.en_HK
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143-
dc.relation.ispartofProceedings - International Computer Software and Applications Conferenceen_HK
dc.rights©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectContinuous integrationen_HK
dc.subjectFault localizationen_HK
dc.subjectSoftware process integrationen_HK
dc.subjectTest case prioritizationen_HK
dc.titleHow well do test case prioritization techniques support statistical fault localizationen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0730-3157&volume=1&spage=99&epage=106&date=2009&atitle=How+well+do+test+case+prioritization+techniques+support+statistical+fault+localization+-
dc.identifier.emailTse, TH: thtse@cs.hku.hken_HK
dc.identifier.authorityTse, TH=rp00546en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/COMPSAC.2009.23en_HK
dc.identifier.scopuseid_2-s2.0-70449637968en_HK
dc.identifier.hkuros155426-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-70449637968&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume1en_HK
dc.identifier.spage99en_HK
dc.identifier.epage106en_HK
dc.identifier.isiWOS:000274261400013-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridJiang, B=35199818000en_HK
dc.identifier.scopusauthoridZhang, Z=10639502200en_HK
dc.identifier.scopusauthoridTse, TH=7005496974en_HK
dc.identifier.scopusauthoridChen, TY=13104290200en_HK
dc.identifier.citeulike10413909-
dc.identifier.issnl0730-3157-

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