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- PMID: 14649282
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Article: Spectroscopic ellipsometry of metal phthalocyanine thin films
Title | Spectroscopic ellipsometry of metal phthalocyanine thin films |
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Authors | |
Issue Date | 2003 |
Publisher | Optical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfm |
Citation | Applied Optics, 2003, v. 42 n. 31, p. 6382-6387 How to Cite? |
Abstract | Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-of-refraction data for NiPc and FePc are reported for the first time to our knowledge. Good agreement with the experimental spectra was obtained for all three materials. © 2003 Optical Society of America. |
Persistent Identifier | http://hdl.handle.net/10722/70078 |
ISSN | 2010 Impact Factor: 1.707 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Djurišić, AB | en_HK |
dc.contributor.author | Kwong, CY | en_HK |
dc.contributor.author | Lau, TW | en_HK |
dc.contributor.author | Liu, ZT | en_HK |
dc.contributor.author | Kwok, HS | en_HK |
dc.contributor.author | Lam, LSM | en_HK |
dc.contributor.author | Chan, WK | en_HK |
dc.date.accessioned | 2010-09-06T06:19:30Z | - |
dc.date.available | 2010-09-06T06:19:30Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | Applied Optics, 2003, v. 42 n. 31, p. 6382-6387 | en_HK |
dc.identifier.issn | 0003-6935 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/70078 | - |
dc.description.abstract | Optical functions of cobalt phthalocyanine, nickel phthalocyanine (NiPc), and iron phthalocyanine (FePc) have been determined by use of spectroscopic ellipsometry in the spectral range 1.55-4.1 eV (300-800 nm). The samples were prepared by evaporation onto glass and silicon substrates. The optical functions were determined by point-to-point fit. Absorption spectra were also measured. The index-of-refraction data for NiPc and FePc are reported for the first time to our knowledge. Good agreement with the experimental spectra was obtained for all three materials. © 2003 Optical Society of America. | en_HK |
dc.language | eng | en_HK |
dc.publisher | Optical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfm | en_HK |
dc.relation.ispartof | Applied Optics | en_HK |
dc.rights | Applied Optics. Copyright © Optical Society of America. | en_HK |
dc.rights | This paper was published in [Applied Optics] and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [http://dx.doi.org/10.1364/AO.42.006382]. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law. | - |
dc.title | Spectroscopic ellipsometry of metal phthalocyanine thin films | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6935&volume=42&spage=6382&epage=6387&date=2003&atitle=Spectroscopic+ellipsometry+of+metal+phthalocyanine+thin+films | en_HK |
dc.identifier.email | Djurišić, AB: dalek@hku.hk | en_HK |
dc.identifier.email | Chan, WK: waichan@hku.hk | en_HK |
dc.identifier.authority | Djurišić, AB=rp00690 | en_HK |
dc.identifier.authority | Chan, WK=rp00667 | en_HK |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1364/AO.42.006382 | - |
dc.identifier.pmid | 14649282 | - |
dc.identifier.scopus | eid_2-s2.0-0242609024 | en_HK |
dc.identifier.hkuros | 85637 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0242609024&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 42 | en_HK |
dc.identifier.issue | 31 | en_HK |
dc.identifier.spage | 6382 | en_HK |
dc.identifier.epage | 6387 | en_HK |
dc.identifier.isi | WOS:000186362700019 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Djurišić, AB=7004904830 | en_HK |
dc.identifier.scopusauthorid | Kwong, CY=35917741900 | en_HK |
dc.identifier.scopusauthorid | Lau, TW=36920289100 | en_HK |
dc.identifier.scopusauthorid | Liu, ZT=22934686400 | en_HK |
dc.identifier.scopusauthorid | Kwok, HS=36071953500 | en_HK |
dc.identifier.scopusauthorid | Lam, LSM=7201984714 | en_HK |
dc.identifier.scopusauthorid | Chan, WK=13310083000 | en_HK |
dc.identifier.issnl | 0003-6935 | - |