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Article: Rigorous electromagnetic analysis of a microcylindrical axilens with long focal depth and high transverse resolution

TitleRigorous electromagnetic analysis of a microcylindrical axilens with long focal depth and high transverse resolution
Authors
Dong, BZLiu, JGu, BYYang, GZWang, J
KeywordsElectromagnetic field effects
Integral equations
Lithography
Microelectromechanical devices
Microcylindrical axilens
Issue Date2001
PublisherOptical Society of America. The Journal's web site is located at http://www.opticsinfobase.org/josaa/journal/josaa/about.cfm
Citation
Journal of the Optical Society of America. A: Optics, Image Science, and Vision, 2001, v. 18 n. 7, p. 1465-1470 How to Cite?
DOI: http://dx.doi.org/10.1364/JOSAA.18.001465
AbstractWe first present nonparaxial designs for a microcylindrical axilens with different long focal depths and rigorously analyze electromagnetic field distributions of the axilens using integral equations and the boundary-element method. Numerical results show that the designed axilenses indeed have the special feature of attaining a long focal depth while keeping high transverse resolution for numerical apertures of 2.4, 2.0, and 1.0. The ratio between the extended focal depth of the designed axilens and the focal depth of the conventional focal lens is 1.41, the corresponding maximal extended focal depth of the axilens can reach 28 μm, and the spot size of the focal beam is ∼10 μm over the focal range. © 2001 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/80914
ISSN
1084-7529
2023 Impact Factor: 1.4
2023 SCImago Journal Rankings: 0.459
ISI Accession Number ID
WOS:000169453600006

 

DC FieldValueLanguage
dc.contributor.authorDong, BZen_HK
dc.contributor.authorLiu, Jen_HK
dc.contributor.authorGu, BYen_HK
dc.contributor.authorYang, GZen_HK
dc.contributor.authorWang, Jen_HK
dc.date.accessioned2010-09-06T08:11:41Z-
dc.date.available2010-09-06T08:11:41Z-
dc.date.issued2001en_HK
dc.identifier.citationJournal of the Optical Society of America. A: Optics, Image Science, and Vision, 2001, v. 18 n. 7, p. 1465-1470en_HK
dc.identifier.issn1084-7529en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80914-
dc.description.abstractWe first present nonparaxial designs for a microcylindrical axilens with different long focal depths and rigorously analyze electromagnetic field distributions of the axilens using integral equations and the boundary-element method. Numerical results show that the designed axilenses indeed have the special feature of attaining a long focal depth while keeping high transverse resolution for numerical apertures of 2.4, 2.0, and 1.0. The ratio between the extended focal depth of the designed axilens and the focal depth of the conventional focal lens is 1.41, the corresponding maximal extended focal depth of the axilens can reach 28 μm, and the spot size of the focal beam is ∼10 μm over the focal range. © 2001 Optical Society of America.-
dc.languageengen_HK
dc.publisherOptical Society of America. The Journal's web site is located at http://www.opticsinfobase.org/josaa/journal/josaa/about.cfmen_HK
dc.relation.ispartofJournal of the Optical Society of America. A: Optics, Image Science, and Visionen_HK
dc.rightsJournal of the Optical Society of America. A: Optics, Image Science, and Vision. Copyright © Optical Society of America.en_HK
dc.rightsThis paper was published in Journal of the Optical Society of America. A: Optics, Image Science, and Vision and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:http://www.opticsinfobase.org/abstract.cfm?URI=josaa-18-7-1465. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.-
dc.subjectElectromagnetic field effects-
dc.subjectIntegral equations-
dc.subjectLithography-
dc.subjectMicroelectromechanical devices-
dc.subjectMicrocylindrical axilens-
dc.titleRigorous electromagnetic analysis of a microcylindrical axilens with long focal depth and high transverse resolutionen_HK
dc.typeArticleen_HK
dc.identifier.emailWang, J: jianwang@hkusub.hku.hken_HK
dc.identifier.authorityWang, J=rp00799en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1364/JOSAA.18.001465-
dc.identifier.scopuseid_2-s2.0-0005534306-
dc.identifier.hkuros77470en_HK
dc.identifier.volume18-
dc.identifier.issue7-
dc.identifier.spage1465-
dc.identifier.epage1470-
dc.identifier.isiWOS:000169453600006-
dc.identifier.issnl1084-7529-

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