File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Thickness dependence of superconductivity for YBa2Cu3Oy ultra-thin films

TitleThickness dependence of superconductivity for YBa2Cu3Oy ultra-thin films
Authors
Tang, WHNg, CYYau, BCYGao, J
Issue Date2000
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/sust
Citation
Superconductor Science & Technology, 2000, v. 13 n. 5, p. 580-583 How to Cite?
DOI: http://dx.doi.org/10.1088/0953-2048/13/5/329
AbstractSuperconducting YBa2Cu3Oy ultra-thin films with thicknesses of 2-25 nm were deposited on (100) SrTiO3 substrates. The thickness dependence of superconductivity for YBa2Cu3Oy thin films was investigated. It was found that Tc showed only a small decrease for films with thickness greater than 15 nm, but dropped significantly when less than 10 nm. The variation of Tc with the film thickness fits an empirical relation of Tc0 = Tcbulk(1-dm/d). Based on this relation, a critical thickness dm = 1.56 nm was deduced, suggesting that superconductivity can be expected for one-unit-cell thick YBa2Cu3Oy films.
Persistent Identifierhttp://hdl.handle.net/10722/80969
ISSN
0953-2048
2021 Impact Factor: 3.482
2020 SCImago Journal Rankings: 1.033
ISI Accession Number ID
WOS:000087504100031

 

DC FieldValueLanguage
dc.contributor.authorTang, WHen_HK
dc.contributor.authorNg, CYen_HK
dc.contributor.authorYau, BCYen_HK
dc.contributor.authorGao, Jen_HK
dc.date.accessioned2010-09-06T08:12:17Z-
dc.date.available2010-09-06T08:12:17Z-
dc.date.issued2000en_HK
dc.identifier.citationSuperconductor Science & Technology, 2000, v. 13 n. 5, p. 580-583en_HK
dc.identifier.issn0953-2048en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80969-
dc.description.abstractSuperconducting YBa2Cu3Oy ultra-thin films with thicknesses of 2-25 nm were deposited on (100) SrTiO3 substrates. The thickness dependence of superconductivity for YBa2Cu3Oy thin films was investigated. It was found that Tc showed only a small decrease for films with thickness greater than 15 nm, but dropped significantly when less than 10 nm. The variation of Tc with the film thickness fits an empirical relation of Tc0 = Tcbulk(1-dm/d). Based on this relation, a critical thickness dm = 1.56 nm was deduced, suggesting that superconductivity can be expected for one-unit-cell thick YBa2Cu3Oy films.-
dc.languageengen_HK
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/susten_HK
dc.relation.ispartofSuperconductor Science & Technologyen_HK
dc.rightsSuperconductor Science & Technology. Copyright © Institute of Physics Publishing.-
dc.titleThickness dependence of superconductivity for YBa2Cu3Oy ultra-thin filmsen_HK
dc.typeArticleen_HK
dc.identifier.emailTang, WH: whtang@hku.hken_HK
dc.identifier.emailNg, CY: stephen_ng@hku.hken_HK
dc.identifier.emailGao, J: jugao@hku.hk-
dc.identifier.authorityNg, CY=rp01706en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1088/0953-2048/13/5/329-
dc.identifier.scopuseid_2-s2.0-0013175539-
dc.identifier.hkuros55916en_HK
dc.identifier.volume13-
dc.identifier.issue5-
dc.identifier.spage580-
dc.identifier.epage583-
dc.identifier.isiWOS:000087504100031-
dc.publisher.placeUnited Kingdom-
dc.identifier.issnl0953-2048-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats