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Conference Paper: Adaptive Random Testing with Filtering: An Overhead Reduction Technique
Title | Adaptive Random Testing with Filtering: An Overhead Reduction Technique |
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Authors | |
Issue Date | 2005 |
Citation | 17th International Conference on Software Engineering and Knowledge Engineering (SEKE'05), Taipei, Taiwan, 14-16 July 2005 How to Cite? |
Persistent Identifier | http://hdl.handle.net/10722/93391 |
DC Field | Value | Language |
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dc.contributor.author | Chan, KP | en_HK |
dc.contributor.author | Chen, TY | en_HK |
dc.contributor.author | Towey, DP | en_HK |
dc.date.accessioned | 2010-09-25T14:59:40Z | - |
dc.date.available | 2010-09-25T14:59:40Z | - |
dc.date.issued | 2005 | en_HK |
dc.identifier.citation | 17th International Conference on Software Engineering and Knowledge Engineering (SEKE'05), Taipei, Taiwan, 14-16 July 2005 | - |
dc.identifier.uri | http://hdl.handle.net/10722/93391 | - |
dc.language | eng | en_HK |
dc.relation.ispartof | International Conference on Software Engineering and Knowledge Engineering (SEKE) | en_HK |
dc.title | Adaptive Random Testing with Filtering: An Overhead Reduction Technique | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Chan, KP: kpchan@cs.hku.hk | en_HK |
dc.identifier.authority | Chan, KP=rp00092 | en_HK |
dc.identifier.hkuros | 109667 | en_HK |