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Conference Paper: Characterization of nanoemulsion by atomic force microscopy (AFM) and scanning mobility particle sizer (SMPS)

TitleCharacterization of nanoemulsion by atomic force microscopy (AFM) and scanning mobility particle sizer (SMPS)
Authors
Li, ZFung, YSZhu, DHu, HYou, TChan, KYSun, H
Issue Date2003
Citation
Proceedings of 10th International Beijing Conference and Exhibition on Instrumental Analysis (10th BCEIA), Beijing, October 13-16, 2003, p. F11-12 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/97123

 

DC FieldValueLanguage
dc.contributor.authorLi, Zen_HK
dc.contributor.authorFung, YSen_HK
dc.contributor.authorZhu, Den_HK
dc.contributor.authorHu, Hen_HK
dc.contributor.authorYou, Ten_HK
dc.contributor.authorChan, KYen_HK
dc.contributor.authorSun, Hen_HK
dc.date.accessioned2010-09-25T16:57:17Z-
dc.date.available2010-09-25T16:57:17Z-
dc.date.issued2003en_HK
dc.identifier.citationProceedings of 10th International Beijing Conference and Exhibition on Instrumental Analysis (10th BCEIA), Beijing, October 13-16, 2003, p. F11-12en_HK
dc.identifier.urihttp://hdl.handle.net/10722/97123-
dc.languageengen_HK
dc.relation.ispartofProceedings of 10th International Beijing Conference and Exhibition on Instrumental Analysis (10th BCEIA), Beijing, October 13-16, 2003en_HK
dc.titleCharacterization of nanoemulsion by atomic force microscopy (AFM) and scanning mobility particle sizer (SMPS)en_HK
dc.typeConference_Paperen_HK
dc.identifier.emailFung, YS: ysfung@hku.hken_HK
dc.identifier.emailZhu, D: dr2hu@hkucc.hku.hken_HK
dc.identifier.authorityFung, YS=rp00697en_HK
dc.identifier.hkuros111598en_HK
dc.identifier.spage11en_HK
dc.identifier.epage12en_HK

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