Showing results 5 to 6 of 6
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Title | Author(s) | Issue Date | Views | |
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Positive bias-induced V<inf>th</inf> instability in graphene field effect transistors Journal:IEEE Electron Device Letters | 2012 | 12 | ||
V<inf>th</inf> shift in single-layer graphene field-effect transistors and its correlation with raman inspection Journal:IEEE Transactions on Device and Materials Reliability | 2012 | 13 |