Showing results 6 to 7 of 7
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Title | Author(s) | Issue Date | Views | |
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Threshold voltage and 1/f noise degradation in carbon nanotube field effect transistors under hot-carrier stress Proceeding/Conference:Device Research Conference - Conference Digest, DRC | 2008 | |||
Ultra-high-yield growth of vertical single-walled carbon nanotubes: Hidden roles of hydrogen and oxygen Journal:Proceedings of the National Academy of Sciences of the United States of America | 2005 |