Showing results 50 to 52 of 52
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Title | Author(s) | Issue Date | |
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Scanning probe microscopy-based characterization of ZnO nanorods Proceeding/Conference:INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings | 2010 | ||
Shallow acceptor and hydrogen impurity in p-type arsenic-doped ZnMgO films grown by radio frequency magnetron sputtering Journal:Semiconductor Science and Technology | 2010 | ||
Vacancy-type defects in 6H-silicon carbide induced by He-implantation: A positron annihilation spectroscopy approach Journal:Journal of Physics D: Applied Physics | 2008 |