Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | |
---|---|---|---|
Pinning-Free Edge Contact Monolayer MoS2 FET Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 | ||
Reliability of Ultrathin High-κ Dielectrics on Chemical-vapor Deposited 2D Semiconductors Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 | ||
Switchable NAND and NOR Logic Computing in Single Triple-Gate Monolayer MoS2 n-FET Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 |