Showing results 1 to 5 of 5
Title | Author(s) | Issue Date | |
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2006 | |||
2007 | |||
Gate leakage properties of MOS devices with tri-layer high-k gate dielectric Journal:Microelectronics Reliability | 2007 | ||
A modified Kachanov method for analysis of solids with multiple cracks Journal:Engineering Fracture Mechanics | 2003 | ||
Searching Ultra-compact Pulsar Binaries with Abnormal Timing Behavior Journal:The Astrophysical Journal | 2018 |