Showing results 2 to 5 of 5
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| Title | Author(s) | Issue Date | |
|---|---|---|---|
Impacts of Ti incorporation on the electrical properties and reliability of GaAs metal-oxide-semiconductor capacitors with high-k NdTiON as gate dielectric Proceeding/Conference:IEEE Semiconductor Interface Specialists Conference | 2016 | ||
Improved electrical properties of GaAs MOS capacitor by using HfLaON passivation layer Proceeding/Conference:IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) | 2016 | ||
Improved performance of pentacene OTFT by incorporating Ti in NdON gate dielectric Proceeding/Conference:IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) | 2017 | ||
Structure and assembly of cargo Rubisco in two native α-carboxysomes Journal:Nature Communications | 25-Jul-2022 |