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Article: An improved differential voltage technique for capacitance measurement
Title | An improved differential voltage technique for capacitance measurement |
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Authors | |
Issue Date | 1988 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/sse |
Citation | Solid State Electronics, 1988, v. 31 n. 2, p. 167-170 How to Cite? |
Abstract | A differential voltage capacitance technique is described for measuring the capacitance of forward-biased Schottky diodes. This technique is based on the concept of an improved admittance bridge. Difficulties arising from the high conductive component were solved or minimized. Data were obtained for NiSi and PdGaAs Schottky diodes with quality factors as low as 0.001. Compared to accurate phase capacitance spectroscopy and other bridge methods, this technique is more reliable and easier to operate. © 1988. |
Persistent Identifier | http://hdl.handle.net/10722/154876 |
ISSN | 2021 Impact Factor: 1.916 2020 SCImago Journal Rankings: 0.457 |
DC Field | Value | Language |
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dc.contributor.author | Wu, X | en_US |
dc.contributor.author | Evans, HL | en_US |
dc.contributor.author | Yang, ES | en_US |
dc.date.accessioned | 2012-08-08T08:31:00Z | - |
dc.date.available | 2012-08-08T08:31:00Z | - |
dc.date.issued | 1988 | en_US |
dc.identifier.citation | Solid State Electronics, 1988, v. 31 n. 2, p. 167-170 | en_US |
dc.identifier.issn | 0038-1101 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/154876 | - |
dc.description.abstract | A differential voltage capacitance technique is described for measuring the capacitance of forward-biased Schottky diodes. This technique is based on the concept of an improved admittance bridge. Difficulties arising from the high conductive component were solved or minimized. Data were obtained for NiSi and PdGaAs Schottky diodes with quality factors as low as 0.001. Compared to accurate phase capacitance spectroscopy and other bridge methods, this technique is more reliable and easier to operate. © 1988. | en_US |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/sse | en_US |
dc.relation.ispartof | Solid State Electronics | en_US |
dc.title | An improved differential voltage technique for capacitance measurement | en_US |
dc.type | Article | en_US |
dc.identifier.email | Yang, ES:esyang@hkueee.hku.hk | en_US |
dc.identifier.authority | Yang, ES=rp00199 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.scopus | eid_2-s2.0-0023961935 | en_US |
dc.identifier.volume | 31 | en_US |
dc.identifier.issue | 2 | en_US |
dc.identifier.spage | 167 | en_US |
dc.identifier.epage | 170 | en_US |
dc.publisher.place | United Kingdom | en_US |
dc.identifier.scopusauthorid | Wu, X=7407065023 | en_US |
dc.identifier.scopusauthorid | Evans, HL=7401520988 | en_US |
dc.identifier.scopusauthorid | Yang, ES=7202021229 | en_US |
dc.identifier.issnl | 0038-1101 | - |