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Article: Temperature mapping and thermal lensing in large-mode, high-power laser diodes
Title | Temperature mapping and thermal lensing in large-mode, high-power laser diodes |
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Authors | |
Issue Date | 2006 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 2006, v. 89 n. 20, article no. 201110 How to Cite? |
Abstract | The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ=1.55 μm InGaAsPInP watt-class laser that has a large (>5×5 μ m2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices. © 2006 American Institute of Physics. |
Persistent Identifier | http://hdl.handle.net/10722/156861 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Chan, PKL | en_US |
dc.contributor.author | Pipe, KP | en_US |
dc.contributor.author | Plant, JJ | en_US |
dc.contributor.author | Swint, RB | en_US |
dc.contributor.author | Juodawlkis, PW | en_US |
dc.date.accessioned | 2012-08-08T08:44:19Z | - |
dc.date.available | 2012-08-08T08:44:19Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.citation | Applied Physics Letters, 2006, v. 89 n. 20, article no. 201110 | - |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/156861 | - |
dc.description.abstract | The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ=1.55 μm InGaAsPInP watt-class laser that has a large (>5×5 μ m2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices. © 2006 American Institute of Physics. | en_US |
dc.language | eng | en_US |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_US |
dc.relation.ispartof | Applied Physics Letters | en_US |
dc.title | Temperature mapping and thermal lensing in large-mode, high-power laser diodes | en_US |
dc.type | Article | en_US |
dc.identifier.email | Chan, PKL:pklc@hku.hk | en_US |
dc.identifier.authority | Chan, PKL=rp01532 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1063/1.2388884 | en_US |
dc.identifier.scopus | eid_2-s2.0-33751101574 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33751101574&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 89 | en_US |
dc.identifier.issue | 20 | en_US |
dc.identifier.spage | article no. 201110 | - |
dc.identifier.epage | article no. 201110 | - |
dc.identifier.isi | WOS:000242100200010 | - |
dc.publisher.place | United States | en_US |
dc.identifier.scopusauthorid | Chan, PKL=35742829700 | en_US |
dc.identifier.scopusauthorid | Pipe, KP=6603768450 | en_US |
dc.identifier.scopusauthorid | Plant, JJ=7103190594 | en_US |
dc.identifier.scopusauthorid | Swint, RB=6603698023 | en_US |
dc.identifier.scopusauthorid | Juodawlkis, PW=6603752090 | en_US |
dc.identifier.issnl | 0003-6951 | - |