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Conference Paper: Quantitatively control of carbon nanotubes using real time electrical detection dielectrophoresis assembly

TitleQuantitatively control of carbon nanotubes using real time electrical detection dielectrophoresis assembly
Authors
Chen, LYu, MXi, NZhou, ZSong, BYang, YSun, ZHao, YDong, L
KeywordsCarbon Nanotube
Dielectrophoresis
Quantitative
Real Time
Issue Date2015
PublisherIEEE.
Citation
The 15th IEEE International Conference on Nanotechnology (IEEE-NANO 2015), Rome, Italy, 27-30 July 2015. In Conference Proceedings, 2015, p. 1029-1032 How to Cite?
DOI: http://dx.doi.org/10.1109/NANO.2015.7388795
AbstractThe suspended carbon nanotubes (CNT) are widely integrated into silicon based devices in the realm of sensors and micro/nano electromechanical systems (MEMS and NEMS). CNT integration methods have to guarantee yield, low cost, and high performances. In this paper, it reports a novel real-time dielectrophoresis (DEP) assembly method which will monitor quantity of carbon nanotubes between a localized gap. It measures impedance change through the rate of current change when nanotubes are bridged so that there is no impedance limitation. The impedance detection will be feed back to shut down the electrical field applied. The proposed method will not only work for quantitatively nanotubes assembly, but also be applicable for thin layers graphene deposition. © 2015 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/235000
ISBN
978-146738155-0

 

DC FieldValueLanguage
dc.contributor.authorChen, L-
dc.contributor.authorYu, M-
dc.contributor.authorXi, N-
dc.contributor.authorZhou, Z-
dc.contributor.authorSong, B-
dc.contributor.authorYang, Y-
dc.contributor.authorSun, Z-
dc.contributor.authorHao, Y-
dc.contributor.authorDong, L-
dc.date.accessioned2016-10-14T13:50:38Z-
dc.date.available2016-10-14T13:50:38Z-
dc.date.issued2015-
dc.identifier.citationThe 15th IEEE International Conference on Nanotechnology (IEEE-NANO 2015), Rome, Italy, 27-30 July 2015. In Conference Proceedings, 2015, p. 1029-1032-
dc.identifier.isbn978-146738155-0-
dc.identifier.urihttp://hdl.handle.net/10722/235000-
dc.description.abstractThe suspended carbon nanotubes (CNT) are widely integrated into silicon based devices in the realm of sensors and micro/nano electromechanical systems (MEMS and NEMS). CNT integration methods have to guarantee yield, low cost, and high performances. In this paper, it reports a novel real-time dielectrophoresis (DEP) assembly method which will monitor quantity of carbon nanotubes between a localized gap. It measures impedance change through the rate of current change when nanotubes are bridged so that there is no impedance limitation. The impedance detection will be feed back to shut down the electrical field applied. The proposed method will not only work for quantitatively nanotubes assembly, but also be applicable for thin layers graphene deposition. © 2015 IEEE.-
dc.languageeng-
dc.publisherIEEE.-
dc.relation.ispartofIEEE International Conference on Nanotechnology (IEEE-NANO) Proceedings-
dc.rightsIEEE International Conference on Nanotechnology (IEEE-NANO) Proceedings. Copyright © IEEE.-
dc.rights©2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.subjectCarbon Nanotube-
dc.subjectDielectrophoresis-
dc.subjectQuantitative-
dc.subjectReal Time-
dc.titleQuantitatively control of carbon nanotubes using real time electrical detection dielectrophoresis assembly-
dc.typeConference_Paper-
dc.identifier.emailXi, N: xining@hku.hk-
dc.identifier.authorityXi, N=rp02044-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NANO.2015.7388795-
dc.identifier.scopuseid_2-s2.0-84964344822-
dc.identifier.hkuros269248-
dc.identifier.spage1029-
dc.identifier.epage1032-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 161018-

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