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Article: Nano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold

TitleNano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold
Authors
Issue Date2016
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2016, v. 120 n. 16, article no. 165704 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/247453
ISSN
2019 Impact Factor: 2.286
2015 SCImago Journal Rankings: 0.603
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorGriffiths, JT-
dc.contributor.authorZhang, S-
dc.contributor.authorLhuillier, J-
dc.contributor.authorZhu, D-
dc.contributor.authorFu, WYG-
dc.contributor.authorHowkins, A-
dc.contributor.authorBoyd, I-
dc.contributor.authorStowe, D-
dc.contributor.authorWallis, DJ-
dc.contributor.authorHumphreys, CJ-
dc.contributor.authorOliver, RA-
dc.date.accessioned2017-10-18T08:27:30Z-
dc.date.available2017-10-18T08:27:30Z-
dc.date.issued2016-
dc.identifier.citationJournal of Applied Physics, 2016, v. 120 n. 16, article no. 165704-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10722/247453-
dc.languageeng-
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp-
dc.relation.ispartofJournal of Applied Physics-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleNano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold-
dc.typeArticle-
dc.identifier.emailFu, WYG: wyfu@hku.hk-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4965989-
dc.identifier.scopuseid_2-s2.0-84994050068-
dc.identifier.hkuros282430-
dc.identifier.volume120-
dc.identifier.issue16-
dc.identifier.spagearticle no. 165704-
dc.identifier.epagearticle no. 165704-
dc.identifier.isiWOS:000387580600067-
dc.publisher.placeUnited States-

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