File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Nano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold

TitleNano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold
Authors
Griffiths, JTZhang, SLhuillier, JZhu, DFu, WYGHowkins, ABoyd, IStowe, DWallis, DJHumphreys, CJOliver, RA
Issue Date2016
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2016, v. 120 n. 16, article no. 165704 How to Cite?
DOI: http://dx.doi.org/10.1063/1.4965989
Persistent Identifierhttp://hdl.handle.net/10722/247453
ISSN
0021-8979
2019 Impact Factor: 2.286
2015 SCImago Journal Rankings: 0.603
ISI Accession Number ID
WOS:000387580600067

 

DC FieldValueLanguage
dc.contributor.authorGriffiths, JT-
dc.contributor.authorZhang, S-
dc.contributor.authorLhuillier, J-
dc.contributor.authorZhu, D-
dc.contributor.authorFu, WYG-
dc.contributor.authorHowkins, A-
dc.contributor.authorBoyd, I-
dc.contributor.authorStowe, D-
dc.contributor.authorWallis, DJ-
dc.contributor.authorHumphreys, CJ-
dc.contributor.authorOliver, RA-
dc.date.accessioned2017-10-18T08:27:30Z-
dc.date.available2017-10-18T08:27:30Z-
dc.date.issued2016-
dc.identifier.citationJournal of Applied Physics, 2016, v. 120 n. 16, article no. 165704-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10722/247453-
dc.languageeng-
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp-
dc.relation.ispartofJournal of Applied Physics-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleNano-cathodoluminescence reveals the effect of electron damage on the optical properties of nitride optoelectronics and the damage threshold-
dc.typeArticle-
dc.identifier.emailFu, WYG: wyfu@hku.hk-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4965989-
dc.identifier.scopuseid_2-s2.0-84994050068-
dc.identifier.hkuros282430-
dc.identifier.volume120-
dc.identifier.issue16-
dc.identifier.spagearticle no. 165704-
dc.identifier.epagearticle no. 165704-
dc.identifier.isiWOS:000387580600067-
dc.publisher.placeUnited States-

Export via OAI-PMH Interface in XML Formats

OR

Export to Other Non-XML Formats