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Article: STM Imaging of Electron Migration in Real Space and Time: A Simulation Study

TitleSTM Imaging of Electron Migration in Real Space and Time: A Simulation Study
Authors
KeywordsScanning tunneling microscopy
optical pump-probe
charge migration
time-dependent simulation
Issue Date2019
PublisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/nanolett
Citation
Nano Letters, 2019, v. 19 n. 10, p. 7006-7012 How to Cite?
AbstractUsing a simulation protocol that mimics ultrafast scanning tunneling microscopy (STM) experiments, we demonstrate how pump-probe ultrafast STM may be used to image electron migration in molecules. Two pulses are applied to a model system, and the time-integrated current through the tip is calculated versus the delay time and tip position to generate STM images. With suitable pump and probe parameters, the images can track charge migration with atomistic spatial and femtosecond temporal resolutions.
Persistent Identifierhttp://hdl.handle.net/10722/279302
ISSN
2019 Impact Factor: 11.238
2015 SCImago Journal Rankings: 9.006
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorKwok, YH-
dc.contributor.authorChen, G-
dc.contributor.authorMukamel, S-
dc.date.accessioned2019-10-25T13:53:06Z-
dc.date.available2019-10-25T13:53:06Z-
dc.date.issued2019-
dc.identifier.citationNano Letters, 2019, v. 19 n. 10, p. 7006-7012-
dc.identifier.issn1530-6984-
dc.identifier.urihttp://hdl.handle.net/10722/279302-
dc.description.abstractUsing a simulation protocol that mimics ultrafast scanning tunneling microscopy (STM) experiments, we demonstrate how pump-probe ultrafast STM may be used to image electron migration in molecules. Two pulses are applied to a model system, and the time-integrated current through the tip is calculated versus the delay time and tip position to generate STM images. With suitable pump and probe parameters, the images can track charge migration with atomistic spatial and femtosecond temporal resolutions.-
dc.languageeng-
dc.publisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/nanolett-
dc.relation.ispartofNano Letters-
dc.rightsThis document is the Accepted Manuscript version of a Published Work that appeared in final form in [JournalTitle], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [insert ACS Articles on Request author-directed link to Published Work, see http://pubs.acs.org/page/policy/articlesonrequest/index.html].-
dc.subjectScanning tunneling microscopy-
dc.subjectoptical pump-probe-
dc.subjectcharge migration-
dc.subjecttime-dependent simulation-
dc.titleSTM Imaging of Electron Migration in Real Space and Time: A Simulation Study-
dc.typeArticle-
dc.identifier.emailKwok, YH: balloonr@hku.hk-
dc.identifier.emailChen, G: ghchen@hku.hk-
dc.identifier.authorityChen, G=rp00671-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/acs.nanolett.9b02389-
dc.identifier.pmid31509425-
dc.identifier.scopuseid_2-s2.0-85072923840-
dc.identifier.hkuros308243-
dc.identifier.volume19-
dc.identifier.issue10-
dc.identifier.spage7006-
dc.identifier.epage7012-
dc.identifier.isiWOS:000490353500036-
dc.publisher.placeUnited States-

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