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Conference Paper: Overcoming Positioning Uncertainty for AFM-based Nanorobots using Spiral Local Scan in Non-vector Space

TitleOvercoming Positioning Uncertainty for AFM-based Nanorobots using Spiral Local Scan in Non-vector Space
Authors
Issue Date2019
PublisherIEEE. The Proceedings' web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001116
Citation
2019 IEEE 14th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), Bangkok, Thailand, 11-14 April 2019, p. 447-450 How to Cite?
AbstractAtomic force microscopy (AFM) based manipulation technologies have been attractive for decades due to the overwhelming advantages of nanometer spatial resolution, universal working environment, and various mechanical measurement methods. It is noted that though the AFM possesses nanometer imaging resolution, it is hard to achieve nanometer locating precision due to uncertainties, especially the thermal drift which distorts AFM images through relatively long capturing time. Since an AFM image is typically utilized as a reference map for nanomanipulation, the uncertainty induced distorted image will definitely introduce location deviation between the real nano-world and the captured, which usually leads to low efficiency or even failure of tasks. Therefore, to achieve high accuracy for AFM-based manipulation, the positioning uncertainty should be detected and then overcome. In this study, we present a universal approach to quantitatively measure and overcome nanorobot tip locating uncertainty by developing a featureless spiral local scan strategy together with the non-vector space (NVS) navigation approach. Experimental study reveals that variation of the tip locating uncertainty of AFM fast axis is more significant than that of the slow axis with different scan angles.
Persistent Identifierhttp://hdl.handle.net/10722/282987
ISBN

 

DC FieldValueLanguage
dc.contributor.authorSun, Z-
dc.contributor.authorXi, N-
dc.contributor.authorYu, H-
dc.contributor.authorXue, Y-
dc.contributor.authorBi, S-
dc.contributor.authorChen, L-
dc.date.accessioned2020-06-05T06:23:47Z-
dc.date.available2020-06-05T06:23:47Z-
dc.date.issued2019-
dc.identifier.citation2019 IEEE 14th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), Bangkok, Thailand, 11-14 April 2019, p. 447-450-
dc.identifier.isbn978-1-7281-1630-3-
dc.identifier.urihttp://hdl.handle.net/10722/282987-
dc.description.abstractAtomic force microscopy (AFM) based manipulation technologies have been attractive for decades due to the overwhelming advantages of nanometer spatial resolution, universal working environment, and various mechanical measurement methods. It is noted that though the AFM possesses nanometer imaging resolution, it is hard to achieve nanometer locating precision due to uncertainties, especially the thermal drift which distorts AFM images through relatively long capturing time. Since an AFM image is typically utilized as a reference map for nanomanipulation, the uncertainty induced distorted image will definitely introduce location deviation between the real nano-world and the captured, which usually leads to low efficiency or even failure of tasks. Therefore, to achieve high accuracy for AFM-based manipulation, the positioning uncertainty should be detected and then overcome. In this study, we present a universal approach to quantitatively measure and overcome nanorobot tip locating uncertainty by developing a featureless spiral local scan strategy together with the non-vector space (NVS) navigation approach. Experimental study reveals that variation of the tip locating uncertainty of AFM fast axis is more significant than that of the slow axis with different scan angles.-
dc.languageeng-
dc.publisherIEEE. The Proceedings' web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001116-
dc.relation.ispartofIEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Proceedings-
dc.rightsIEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Proceedings. Copyright © IEEE.-
dc.rights©2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleOvercoming Positioning Uncertainty for AFM-based Nanorobots using Spiral Local Scan in Non-vector Space-
dc.typeConference_Paper-
dc.identifier.emailXi, N: xining@hku.hk-
dc.identifier.emailBi, S: shengbi@hku.hk-
dc.identifier.authorityXi, N=rp02044-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NEMS.2019.8915662-
dc.identifier.hkuros310092-
dc.identifier.spage447-
dc.identifier.epage450-
dc.publisher.placeUnited States-

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