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Article: Disconnection-mediated twin junction migration mechanism in FCC metals

TitleDisconnection-mediated twin junction migration mechanism in FCC metals
Authors
Kaufman, TChen, KHan, JFan, CXu, MYe, FSrolovitz, DJPan, X
Issue Date2021
Citation
Microscopy and Microanalysis, 2021, v. 27, p. 3100-3102 How to Cite?
DOI: http://dx.doi.org/10.1017/S1431927621010734
Persistent Identifierhttp://hdl.handle.net/10722/322325

 

DC FieldValueLanguage
dc.contributor.authorKaufman, T-
dc.contributor.authorChen, K-
dc.contributor.authorHan, J-
dc.contributor.authorFan, C-
dc.contributor.authorXu, M-
dc.contributor.authorYe, F-
dc.contributor.authorSrolovitz, DJ-
dc.contributor.authorPan, X-
dc.date.accessioned2022-11-14T08:20:05Z-
dc.date.available2022-11-14T08:20:05Z-
dc.date.issued2021-
dc.identifier.citationMicroscopy and Microanalysis, 2021, v. 27, p. 3100-3102-
dc.identifier.urihttp://hdl.handle.net/10722/322325-
dc.languageeng-
dc.relation.ispartofMicroscopy and Microanalysis-
dc.titleDisconnection-mediated twin junction migration mechanism in FCC metals-
dc.typeArticle-
dc.identifier.emailSrolovitz, DJ: srol@hku.hk-
dc.identifier.authoritySrolovitz, DJ=rp02868-
dc.identifier.doi10.1017/S1431927621010734-
dc.identifier.hkuros341548-
dc.identifier.volume27-
dc.identifier.spage3100-
dc.identifier.epage3102-

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