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Article: Current-induced effect on the resistivity of epitaxial thin films of La 0.7Ca 0.3MnO 3 and La 0.85Ba 0.15MnO 3
Title | Current-induced effect on the resistivity of epitaxial thin films of La 0.7Ca 0.3MnO 3 and La 0.85Ba 0.15MnO 3 |
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Authors | |
Keywords | Physics engineering |
Issue Date | 2003 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 2003, v. 82 n. 26, p. 4732-4734 How to Cite? |
Abstract | A study was performed on the current-induced effect on the resistivity of epitaxial thin films of La 0.7Ca 0.3MnO 3 and La 0.85Ba 0.15MnO 3. The peak resistance showed a significant change at different current or current resistance. It was found that for both the compounds the dependence of the measured resistance on current revealed a good linear relationship. |
Persistent Identifier | http://hdl.handle.net/10722/42483 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gao, J | en_HK |
dc.contributor.author | Shen, SQ | en_HK |
dc.contributor.author | Li, TK | en_HK |
dc.contributor.author | Sun, JR | en_HK |
dc.date.accessioned | 2007-01-29T08:50:55Z | - |
dc.date.available | 2007-01-29T08:50:55Z | - |
dc.date.issued | 2003 | en_HK |
dc.identifier.citation | Applied Physics Letters, 2003, v. 82 n. 26, p. 4732-4734 | - |
dc.identifier.issn | 0003-6951 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/42483 | - |
dc.description.abstract | A study was performed on the current-induced effect on the resistivity of epitaxial thin films of La 0.7Ca 0.3MnO 3 and La 0.85Ba 0.15MnO 3. The peak resistance showed a significant change at different current or current resistance. It was found that for both the compounds the dependence of the measured resistance on current revealed a good linear relationship. | en_HK |
dc.format.extent | 64195 bytes | - |
dc.format.extent | 28672 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.format.mimetype | application/msword | - |
dc.language | eng | en_HK |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_HK |
dc.relation.ispartof | Applied Physics Letters | en_HK |
dc.rights | Copyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2003, v. 82 n. 26, p. 4732-4734 and may be found at https://doi.org/10.1063/1.1587001 | - |
dc.subject | Physics engineering | en_HK |
dc.title | Current-induced effect on the resistivity of epitaxial thin films of La 0.7Ca 0.3MnO 3 and La 0.85Ba 0.15MnO 3 | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0003-6951&volume=82&issue=26&spage=4732&epage=4734&date=2003&atitle=Current-induced+effect+on+the+resistivity+of+epitaxial+thin+films+of+La[sub+0.7]Ca[sub+0.3]MnO[sub+3]+and+La[sub+0.85]Ba[sub+0.15]MnO[sub+3] | en_HK |
dc.identifier.email | Shen, SQ: sshen@hkucc.hku.hk | en_HK |
dc.identifier.authority | Shen, SQ=rp00775 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1063/1.1587001 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0038444698 | en_HK |
dc.identifier.hkuros | 77187 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0038444698&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 82 | en_HK |
dc.identifier.issue | 26 | en_HK |
dc.identifier.spage | 4732 | en_HK |
dc.identifier.epage | 4734 | en_HK |
dc.identifier.isi | WOS:000183757400034 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Gao, J=37262424300 | en_HK |
dc.identifier.scopusauthorid | Shen, SQ=7403431266 | en_HK |
dc.identifier.scopusauthorid | Li, TK=24352391500 | en_HK |
dc.identifier.scopusauthorid | Sun, JR=8583728700 | en_HK |
dc.identifier.issnl | 0003-6951 | - |