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- Publisher Website: 10.1063/1.2712932
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- PMID: 17411199
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Article: Method for measurement of the density of thin films of small organic molecules
Title | Method for measurement of the density of thin films of small organic molecules |
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Authors | |
Issue Date | 2007 |
Publisher | American Institute of Physics. The Journal's web site is located at http://ojps.aip.org/rsio/ |
Citation | Review of Scientific Instruments, 2007, v. 78 n. 3, article no. 034104 How to Cite? |
Abstract | An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking. © 2007 American Institute of Physics. |
Persistent Identifier | http://hdl.handle.net/10722/57314 |
ISSN | 2023 Impact Factor: 1.3 2023 SCImago Journal Rankings: 0.434 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Xiang, HF | en_HK |
dc.contributor.author | Xu, ZX | en_HK |
dc.contributor.author | Roy, VAL | en_HK |
dc.contributor.author | Che, CM | en_HK |
dc.contributor.author | Lai, PT | en_HK |
dc.date.accessioned | 2010-04-12T01:32:52Z | - |
dc.date.available | 2010-04-12T01:32:52Z | - |
dc.date.issued | 2007 | en_HK |
dc.identifier.citation | Review of Scientific Instruments, 2007, v. 78 n. 3, article no. 034104 | - |
dc.identifier.issn | 0034-6748 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/57314 | - |
dc.description.abstract | An accurate and sensitive method is reported to measure the thin-film density of vacuum-deposited, small-molecular organic semiconductor materials. A spectrophotometer and surface profiler had been used to determine the mass and thickness of organic thin film, respectively. The calculated density of tris-(8-hydroxyquinolato) aluminum (Alq3) thin film was 1.31±0.01 g/cm3. Vacuum pressures and thin-film growth rates are found to have less impact on the thin-film density of organic material. However, the thin-film density of organic material strongly depends on its chemical structure and molecular weight. Specifically, the chemical structure determines the density of organic material that affects the molecular volume and intermolecular stacking. © 2007 American Institute of Physics. | en_HK |
dc.language | eng | en_HK |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://ojps.aip.org/rsio/ | en_HK |
dc.relation.ispartof | Review of Scientific Instruments | en_HK |
dc.rights | Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments, 2007, v. 78 n. 3, article no. 034104 and may be found at https://doi.org/10.1063/1.2712932 | - |
dc.subject.mesh | Organic Chemicals - chemistry | en_HK |
dc.subject.mesh | Spectrophotometry - instrumentation | en_HK |
dc.subject.mesh | Molecular Structure | en_HK |
dc.subject.mesh | Semiconductors | en_HK |
dc.subject.mesh | Surface Properties | en_HK |
dc.title | Method for measurement of the density of thin films of small organic molecules | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0034-6748&volume=78&issue=3&spage=034104&epage=1 &date=2007&atitle=Method+for+measurement+of+the+density+of+thin+films+of+small+organic+molecules+ | en_HK |
dc.identifier.email | Xiang, HF:hfxiang@eee.hku.hk | en_HK |
dc.identifier.email | Che, CM:cmche@hku.hk | en_HK |
dc.identifier.email | Lai, PT:laip@eee.hku.hk | en_HK |
dc.identifier.authority | Xiang, HF=rp00196 | en_HK |
dc.identifier.authority | Che, CM=rp00670 | en_HK |
dc.identifier.authority | Lai, PT=rp00130 | en_HK |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1063/1.2712932 | en_HK |
dc.identifier.pmid | 17411199 | - |
dc.identifier.scopus | eid_2-s2.0-34047109700 | en_HK |
dc.identifier.hkuros | 137086 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-34047109700&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 78 | en_HK |
dc.identifier.issue | 3 | - |
dc.identifier.spage | article no. 034104 | - |
dc.identifier.epage | article no. 034104 | - |
dc.identifier.isi | WOS:000245320800030 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Xiang, HF=23065758900 | en_HK |
dc.identifier.scopusauthorid | Xu, ZX=8726524500 | en_HK |
dc.identifier.scopusauthorid | Roy, VAL=7005870324 | en_HK |
dc.identifier.scopusauthorid | Che, CM=7102442791 | en_HK |
dc.identifier.scopusauthorid | Lai, PT=7202946460 | en_HK |
dc.identifier.issnl | 0034-6748 | - |