Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Comparison between TaON/SiO2 and HfON/SiO2 as dual tunnel layer in charge-trapping flash memory applications Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings | 2012 | ||
Improved Memory Window of MONOS Memory Capacitor with GdON as Charge Storage Layer Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings | 2012 |