Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs Journal:Microelectronics Reliability | 2012 | ||
Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings | 2013 |