Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Effects of Coulomb and Roughness Scatterings on 4H-SiC MOSFET Proceeding/Conference:IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) | 2019 | ||
| 1-Apr-2023 |