Showing results 1 to 2 of 2
Title | Author(s) | Issue Date | |
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Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 1-Feb-2023 | ||
Variational analog integrated circuit design via symbolic sensitivity analysis Proceeding/Conference:Proceedings - IEEE International Symposium on Circuits and Systems | 2009 |