Browsing by Author Zhang, Ruizhe

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TitleAuthor(s)Issue Date
 
1 kV GaN-on-Si Quasi-Vertical Schottky Rectifier
Journal:IEEE Electron Device Letters
2023
 
2021
A Converter Based Switching Loss Measurement Method for WBG Device
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
A Simple and Accurate Method to Characterize Output Capacitance Losses of GaN HEMTs
Proceeding/Conference:2022 IEEE Energy Conversion Congress and Exposition, ECCE 2022
2022
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2022
2022
 
2022
 
2023
 
Degradation of SiC MOSFETs Under High-Bias Switching Events
Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics
2022
 
Design and simulation of gan superjunction transistors with 2-deg channels and fin channels
Journal:IEEE Journal of Emerging and Selected Topics in Power Electronics
2019
 
2023
 
Dynamic R<inf>ON</inf>Free 1.2-kV Vertical GaN JFET
Journal:IEEE Transactions on Electron Devices
2024
 
Evaluation and MHz Converter Application of 1.2-kV Vertical GaN JFET
Journal:IEEE Transactions on Power Electronics
2024
Evaluation of 650V, 100A Direct-Drive GaN Power Switch for Electric Vehicle Powertrain Applications
Proceeding/Conference:2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2021 - Proceedings
2021
Evaluation of Dynamic R<inf>ON</inf>, Coss Loss, and Short-Circuit Ruggedness of 650V and 1200V Industrial Vertical GaN JFETs
Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2024
Failure Mechanisms of Cascode GaN HEMTs under Overvoltage and Surge Energy Events
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2021
GaN HEMTs in High-Frequency Overvoltage Switching: Electrical or Thermal Failure?
Proceeding/Conference:Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
2023
GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery
Proceeding/Conference:IEEE International Reliability Physics Symposium Proceedings
2022
Gate Lifetime of P-Gate GaN HEMT in Inductive Power Switching
Proceeding/Conference:Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2023
Gate Lifetime of P-Gate GaN HEMT under DC and Switching Overvoltage Stress
Proceeding/Conference:2023 IEEE 10th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2023
2023